Zobrazeno 1 - 10
of 126
pro vyhledávání: '"Jang, Kyungsoo"'
Autor:
Nguyen, Cam Phu Thi, Raja, Jayapal, Kim, Sunbo, Jang, Kyungsoo, Le, Anh Huy Tuan, Lee, Youn-Jung, Yi, Junsin
Publikováno v:
In Applied Surface Science 28 February 2017 396:1472-1477
Publikováno v:
In Microelectronic Engineering 1 October 2016 164:14-19
Publikováno v:
In Materials Science in Semiconductor Processing October 2015 38:50-56
Autor:
Raja, Jayapal, Jang, Kyungsoo, Balaji, Nagarajan, Qamar Hussain, Shahzada, Velumani, S., Chatterjee, Somenath, Kim, Taeyong, Yi, Junsin
Publikováno v:
In Materials Science in Semiconductor Processing September 2015 37:129-134
Autor:
Raja, Jayapal, Jung, Sungwook, Jang, Kyungsoo, Jin, Zhenghai, Chatterjee, Somenath, Velumani, S, Kim, Jiwoong, Yi, Junsin
Publikováno v:
In Materials Science in Semiconductor Processing September 2015 37:9-13
Autor:
Baek, Kyunghyun, Jang, Kyungsoo, Lee, Youn-Jung, Ryu, Kyungyul, Choi, Woojin, Kim, Doyoung, Yi, Junsin
Publikováno v:
In Thin Solid Films 15 March 2013 531:349-353
Autor:
Raja, Jayapal, Jang, Kyungsoo, Nguyen, Hong Hanh, Trinh, Thanh Thuy, Choi, Woojin, Yi, Junsin
Publikováno v:
In Current Applied Physics January 2013 13(1):246-251
Autor:
Nguyen, Hong Hanh, Jayapal, Raja, Dang, Ngoc Son, Nguyen, Van Duy, Trinh, Thanh Thuy, Jang, Kyungsoo, Yi, Junsin
Publikováno v:
In Microelectronic Engineering October 2012 98:34-40
Autor:
Cho, Jaehyun, Jung, Sungwook, Jang, Kyungsoo, Park, Hyungsik, Heo, Jongkyu, Lee, Wonbaek, Gong, DaeYoung, Park, Seungman, Choi, Hyungwook, Jung, Hanwook, Choi, Byoungdeog, Yi, Junsin
Publikováno v:
In Microelectronics Reliability 2012 52(1):137-140
Publikováno v:
International Journal of Highway Engineering. 22:59-65
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4fe422c811e9cea34c54c5e1c974e5f0
https://doi.org/10.7855/ijhe.2020.22.3.059
https://doi.org/10.7855/ijhe.2020.22.3.059