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pro vyhledávání: '"Jane Peterkin"'
Autor:
John A. Woollam, R. A. Synowicki, Jeff Hale, S. Zaat, S. Nafis, Jane Peterkin, Robert D. Kubik
Publikováno v:
Thin Solid Films. 206:254-258
Using variable angle spectroscopic ellipsometry and atomic force microscopy (AFM), the surface roughness and oxidation of aluminum and titanium thin films have been studied as a function of substrate deposition temperature and oxygen plasma exposure.
Publikováno v:
MRS Proceedings. 163