Secondary electron emission yield measurements of dielectrics based on a novel collector-only method

Autor: Duncan Verheijde, Jan W. Verhoeven, Gustaaf van Eden

Publikováno v: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 511:6-11

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::6fa4a83638a85b03e977cc13207588ea
https://doi.org/10.1016/j.nimb.2021.11.004

Photoinduced charge separation and recombination under distance, orientation, and spin controlled conditions

Autor: Jan W. Verhoeven, Michael N. Paddon-Row

Publikováno v: International Journal of Photoenergy, Vol 3, Iss 2, Pp 79-87 (2001)

Great efforts have been made to mimic the efficient photoinduced charge separation and concomitant energy storage of natural photosynthetic systems via artificial (supra) molecular constructs as well as to design molecules with potential use for appl

Externí odkaz: https://doaj.org/article/251bc7ffb1144c6c92cc0c032c152638

Ultra-soft X-ray system for imaging the early cellular responses to X-ray induced DNA damage

Autor: Jan W. Verhoeven, Ruben Bosch, Julia von der Lippe, Ron A. Hoebe, Carel H. van Oven, Henk A. van Veen, Emilie C B Desclos, Enzo M. Scutigliani, Barbara Steurer, Lianne E.M. Vriend, Jakub Kochan, Przemek M. Krawczyk, Jurgen A. Marteijn, Meindert Rijpkema, Jan Stap, Irene Stellingwerf, Jacob A. Aten, Matthias van den Belt

Publikováno v: Nucleic Acids Research, 47(17):e100. Oxford University Press
Nucleic Acids Research
Nucleic acids research, 47(17). Oxford University Press

The majority of the proteins involved in processing of DNA double-strand breaks (DSBs) accumulate at the damage sites. Real-time imaging and analysis of these processes, triggered by the so-called microirradiation using UV lasers or heavy particle be

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d5b02951989bdc93e34ef7a6211b7301
https://pure.eur.nl/en/publications/618b0255-c9ff-4d34-b027-d1ced1f9443b

Secondary electron yield measurements of carbon covered multilayer optics

Autor: Maarten Van Kampen, Monika Lubomska, Juequan Chen, Jan W. Verhoeven, Rob Harmsen, Eric Louis, Frederik Bijkerk, Willem van Schaik, Christopher James Lee

Publikováno v: Applied Surface Science, 257, 354-361
Applied surface science, 257(2), 354-361. Elsevier

Carbon contamination on extreme ultraviolet (EUV) optics has been observed in EUV lithography. In this paper, we performed in situ monitoring of the build-up and removal of carbon contamination on Mo/Si EUV multilayers by measuring the secondary elec

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3836367c59cb4dd8a2e6618b9b148d11
https://doi.org/10.1016/j.apsusc.2010.06.075

Coulomb-induced intramolecular exciplex formation in semiflexible donor-bridge-acceptor compounds in nonpolar solvents as a function of temperature

Autor: Jan W. Verhoeven, B. Wegewijs, A. K. F. Ng

Publikováno v: Recueil des travaux chimiques des Pays-Bas = Journal of the Royal Netherlands Chemical Society, 114, 6-12. Royal Netherlands Chemical Society

The mechanism of exciplex formation of two donor-bridge–acceptor compounds, both containing a strong donor - acceptor pair interconnected by a piperidine ring, was studied in nonpolar solvents as a function of temperature. Fluorescence spectra at l

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0fac84cd655170ea03004be963d3a69b
https://doi.org/10.1002/recl.19951140103