Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Jan S. Hoftun"'
Autor:
Benaiah D. Schrag, Xiaoyong Liu, Jan S. Hoftun, Peter L. Klinger, T.M. Levin, David P. Vallett
Publikováno v:
EDFA Technical Articles. 7:24-31
Magnetic field imaging is proving to be a valuable tool for semiconductor failure analysts and test engineers. One of its main advantages is that it does not require sample preparation or deprocessing because magnetic fields pass through most materia
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e73782f7fa9f49b8e8e7f7be70cde4cb
https://doi.org/10.31399/asm.edfa.2005-4.p024
https://doi.org/10.31399/asm.edfa.2005-4.p024
Publikováno v:
International Symposium for Testing and Failure Analysis.
We describe the use of magnetic tunnel junction (MTJ) sensors for the purposes of magnetic current imaging. First, a case study shows how magnetic and current density images generated using an MTJ sensor probe were used to isolate the root cause of f
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::04db28d4a96baab04798f9cd134c4dbf
https://doi.org/10.31399/asm.cp.istfa2006p0013
https://doi.org/10.31399/asm.cp.istfa2006p0013