Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Jan Rutkiewicz"'
Autor:
Piotr Siekański, Krzysztof Magda, Krzysztof Malowany, Jan Rutkiewicz, Adam Styk, Jakub Krzesłowski, Tomasz Kowaluk, Andrzej Zagórski
Publikováno v:
Sensors, Vol 19, Iss 5, p 1074 (2019)
The paper presents the automated on-line system for wood logs 3D geometry scanning. The system consists of 6 laser triangulation scanners and is able to scan full wood logs which can have the diameter ranging from 250 mm to 500 mm and the length up t
Externí odkaz:
https://doaj.org/article/247bebec60c94282a906fac49a82679e
Autor:
Jan Rutkiewicz, Piotr Siekański, Krzysztof Malowany, Adam Styk, Andrzej Zagórski, Jakub Krzesłowski, Tomasz Kowaluk, Krzysztof Magda
Publikováno v:
Sensors (Basel, Switzerland)
Sensors
Volume 19
Issue 5
Sensors, Vol 19, Iss 5, p 1074 (2019)
Sensors
Volume 19
Issue 5
Sensors, Vol 19, Iss 5, p 1074 (2019)
The paper presents the automated on-line system for wood logs 3D geometry scanning. The system consists of 6 laser triangulation scanners and is able to scan full wood logs which can have the diameter ranging from 250 mm to 500 mm and the length up t
Autor:
Piotr Siekański, Piotr Foryś, Marcin Malesa, Maciej Karaszewski, Jan Rutkiewicz, Robert Sitnik
Publikováno v:
Speckle 2018: VII International Conference on Speckle Metrology.
Publikováno v:
Three-Dimensional Image Processing (3DIP) and Applications
In this paper a fully automated 3D shape measurement and processing method is presented. It assumes that positioning of measurement head in relation to measured object can be realized by specialized computer-controlled manipulator. On the base of exi