Zobrazeno 1 - 8
of 8
pro vyhledávání: '"Jamie Tsai"'
Autor:
Hsin-Chun (Jamie) Tsai
Publikováno v:
Jeunesse: Young People, Texts, Cultures. 6:36-55
Critics have suggested that anorexia occurs frequently among middle-class and upper-middle-class adolescent girls. Going through a crucial stage of their development, they starve themselves voluntarily in times of plenty amid societal pressures to be
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e39cd80c5c2665ff04d8dbbffc00676c
https://doi.org/10.3138/jeunesse.6.1.36
https://doi.org/10.3138/jeunesse.6.1.36
Autor:
Hsin-Chun (Jamie) Tsai
Publikováno v:
Jeunesse: Young People, Texts, Cultures. 6:36-55
Critics have suggested that anorexia occurs frequently among middle-class and upper-middle-class adolescent girls. Going through a crucial stage of their development, they starve themselves voluntarily in times of plenty amid societal pressures to be
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::478f66003965d4b2eb2d19644bc06bfc
https://doi.org/10.1353/jeu.2014.0007
https://doi.org/10.1353/jeu.2014.0007
Autor:
Hsin-Chun Jamie Tsai
Publikováno v:
International Research in Children's Literature. 4:151-165
In the light of food studies in social science, this article examines references to food, its connotations and the ways in which cultures use such phenomena to legitimate their systems of meanings and ideologies, and suggests that food in Diana Wynne
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b0dbc25d25ffd98cbc2f91026b5d021d
https://doi.org/10.3366/ircl.2011.0023
https://doi.org/10.3366/ircl.2011.0023
Autor:
Jamie Tsai, Sudhir Baral, Alok Vaid, Roy Kort, Naren Yellai, Byungcheol Kang, Padraig Timoney, Economikos Laertis, Haibo Lu, Prasad Dasari, Paul Isbester
Publikováno v:
SPIE Proceedings.
Copper interconnects have been adopted in advanced semiconductor manufacturing due to benefits of reduced RC delay, cross talk and power consumption. With each technology node, interconnects reduce in size resulting in increased line resistivity, a c
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::264ce1e8e5157fc59841800af0ae3b93
https://doi.org/10.1117/12.2087320
https://doi.org/10.1117/12.2087320
Autor:
Cornel Bozdog, Givantha Iddawela, Michael Klots, Yinon Katz, Byung Cheol (Charles) Kang, Gilad Wainreb, Paul Isbester, Alok Vaid, Matt Sendelbach, Jamie Tsai
Publikováno v:
SPIE Proceedings.
Advanced nodes require precise detection and control of intricate profile details – scatterometry is tool of choice for such requirements. Scatterometry is a model-based technique, and needs extensive reference metrology for qualification. Such ref
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6bbb963f320282d737ec581562088e9e
https://doi.org/10.1117/12.2087232
https://doi.org/10.1117/12.2087232
Autor:
Kartik Venkataraman, Ronny Haupt, Alok Vaid, Young Ki Kim, Stilian Ivanov Pandev, Jamie Tsai, Ren Zhou, Vidya Ramanathan, Lokesh Subramany, Fang Fang, Dimitry Sanko
Publikováno v:
SPIE Proceedings.
CD uniformity requirements at 20nm and more advanced nodes have challenged the precision limits of CD-SEM metrology, conventionally used for scanner qualification and in-line focus/dose monitoring on product wafers. Optical CD metrology has consequen
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::17b26f2a27222bfb82c702ea0b45ff03
https://doi.org/10.1117/12.2086056
https://doi.org/10.1117/12.2086056
Autor:
Shay Wolfling, Cornel Bozdog, Roy Koret, Jamie Tsai, Eyal Grubner, Matthew Sendelbach, Alok Vaid, Carmen Osorio
Publikováno v:
Metrology, Inspection, and Process Control for Microlithography XXVIII.
In recent years Hybrid Metrology has emerged as an option for enhancing the performance of existing measurement toolsets and is currently implemented in production 1 . Hybrid Metrology is the practice to combine measurements from multiple toolset typ
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d10cb55eb8fe230c3bbce4e7d59ac595
https://doi.org/10.1117/12.2048939
https://doi.org/10.1117/12.2048939
Autor:
Cornel Bozdog, Eyal Grubner, Alok Vaid, Matthew Sendelbach, Shay Wolfling, Roy Koret, Jamie Tsai, Carmen Osorio
Publikováno v:
Journal of Micro/Nanolithography, MEMS, and MOEMS. 13:041413
Work using the concept of a co-optimization-based metrology hybridization is presented. Hybrid co-optimization involves the combination of data from two or more metrology tools such that the output of each tool is improved by the output of the other
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::65c4b9e98efddeb4b54ef354e6443a8b
https://doi.org/10.1117/1.jmm.13.4.041413
https://doi.org/10.1117/1.jmm.13.4.041413