Zobrazeno 1 - 10
of 10
pro vyhledávání: '"James Forney"'
Publikováno v:
The FASEB Journal. 36
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::40c9ada3f7c31375d661a80ab1266392
https://doi.org/10.1096/fasebj.2022.36.s1.r3518
https://doi.org/10.1096/fasebj.2022.36.s1.r3518
Autor:
Alyson D. Topper, Melanie D. Berg, Jonathan A. Pellish, Jean-Marie Lauenstein, James Forney, Edward P. Wilcox, Jason M. Osheroff, Peter J. Majewicz, Anthony M. Phan, Hak Kim, Edward J. Wyrwas, Caroline M. Fedele, Megan C. Casey, Max F. Chaiken, Thomas A. Carstens, Martha V. O'Bryan, Michael J. Campola, Donna J. Cochran
Publikováno v:
2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC).
Total ionizing dose, displacement damage dose, and single event effects testing were performed to characterize and determine the suitability of candidate electronics for NASA space utilization. Devices tested include FETs, flash memory, FPGAs, optoel
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::38d74e8e90356b20a9fdd8518e0cdb3b
https://doi.org/10.1109/redw51883.2020.9325841
https://doi.org/10.1109/redw51883.2020.9325841
Publikováno v:
Biochemistry and Molecular Biology Education. 44:517-525
Transformation of research in all biological fields necessitates the design, analysis and, interpretation of large data sets. Preparing students with the requisite skills in experimental design, statistical analysis, and interpretation, and mathemati
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7ed1a3a5836d584bcdc5424e381ea6cb
https://doi.org/10.1002/bmb.20974
https://doi.org/10.1002/bmb.20974
Autor:
Christopher James Forney
Publikováno v:
Comitatus: A Journal of Medieval and Renaissance Studies. 42:55-88
As the settlement and pilgrimage of Santiago de Compostela grew, the city’s central spaces gradually became sources of rupture between local residents and pilgrims. The important places of Compostela, such as religious community buildings, the pala
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5e5e753b8caa22cd1a25200ab7eee635
https://doi.org/10.1353/cjm.2011.0030
https://doi.org/10.1353/cjm.2011.0030
Publikováno v:
Biochemistry and molecular biology education : a bimonthly publication of the International Union of Biochemistry and Molecular Biology. 44(6)
Transformation of research in all biological fields necessitates the design, analysis and, interpretation of large data sets. Preparing students with the requisite skills in experimental design, statistical analysis, and interpretation, and mathemati
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid________::31632f43b510f41639189ef554f7f4ad
https://pubmed.ncbi.nlm.nih.gov/27241938
https://pubmed.ncbi.nlm.nih.gov/27241938
Autor:
James Forney, Alyson D. Topper, Brian Triggs, Ronald Pease, Dakai Chen, Tony Kazmakites, Raymond L. Ladbury, Kenneth A. LaBel
Publikováno v:
2012 IEEE Radiation Effects Data Workshop.
We evaluate the low dose rate sensitivity in several families of discrete bipolar transistors across device parameter, quality assurance level, and irradiation bias configuration. The 2N2222 showed the most significant low dose rate sensitivity, with
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::11d5cd2961fbf799b1a77f728245f6aa
https://doi.org/10.1109/redw.2012.6353732
https://doi.org/10.1109/redw.2012.6353732
Autor:
Anthony M. Phan, Bruce Holcombe, G. Chaumont, Kenneth A. LaBel, Bradley A. Little, S.R. Cox, Kirby Kruckmeyer, Al Ouellet, James Forney, Rafi Albarian, Sam Burns, Dakai Chen, Martin A. Carts, James Fred Salzman, Ronald Pease, Herve Duperray
Publikováno v:
2010 IEEE Radiation Effects Data Workshop.
We present results on the effects on ELDRS at dose rates of 10, 5, 1, and 0.5 mrad(Si)/s for a variety of radiation hardened and commercial devices. We observed low dose rate enhancement below 10 mrad(Si)/s in several different parts. The magnitudes
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bcaabe64d62f3680b767bb665450b061
https://doi.org/10.1109/redw.2010.5619506
https://doi.org/10.1109/redw.2010.5619506
Autor:
Paul W. Marshall, James Forney, C. Poivey, Dave Petrick, S.R. Cox, Ray Ladbury, S.P. Buchner, D.K. Hawkins, Mark P. Baze, Anthony Dung-phan, Martin A. Carts, Martha V. O'Bryan, S.D. Kniffin, Christina Seidleck, Jeremy Karsh, A.B. Sanders, Kenneth A. LaBel, Cheryl J. Marshall, Melanie D. Berg, J.W. Howard, Hak Kim, Ryan Flanigan, M. Friendlich, T.R. Oldham, Wes Powell, T.L. Irwin
Publikováno v:
2007 IEEE Radiation Effects Data Workshop.
Susceptibility of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects is studied. Devices tested include digital, linear bipolar, and hybrid devices.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9e2f1ee628870278c3efa00c683b8b39
https://doi.org/10.1109/redw.2007.4342557
https://doi.org/10.1109/redw.2007.4342557
Autor:
Martha O'Bryan, Christian Poivey, Scott Kniffin, Stephen Buchner, Ray Ladbury, Timothy Oldham, James Howard, Kenneth LaBel, Anthony Sanders, Melanie Berg, Cheryl Marshall, Paul Marshall, Hak Kim, Anthony Dung-phan, Donald Hawkins, Martin Carts, James Forney, Tim Irwin, Christina Seidleck, Stephen Cox, Mark Friendlich, Ryan Flanigan, Dave Petrick, Wes Powell, Jeremy Karsh, Mark Baze
Publikováno v:
2006 IEEE Radiation Effects Data Workshop.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f8db4be964dfbf686562d9542579d66d
https://doi.org/10.1109/redw.2006.295463
https://doi.org/10.1109/redw.2006.295463
