Zobrazeno 1 - 4
of 4
pro vyhledávání: '"James E. Doran"'
Autor:
Eric G. Stevens, Ryan Kather, Joseph Summa, Peter Mersich, John McCarten, James E. Doran, Douglas A. Carpenter, Shen Wang, Eric J. Meisenzahl, Robert P. Fabinski, Tom Frank, Stephen L. Kosman, Brian Tobey, Cristian Tivarus, Richard Brolly, Alden Lum, Adam DeJager
Publikováno v:
IEEE Transactions on Electron Devices. 66:1329-1337
This paper describes the design and performance of two new high-resolution interline charge-coupled device image sensors for use in industrial, machine vision, and aerial photography applications. These sensors feature 4.5- $\mu \text{m}$ pixels, 4 o
Autor:
Douglas A. Carpenter, Adam DeJager, Robert P. Fabinski, Andrew Garland, Shen Wang, James E. Doran, Ryan Yaniga, James A. DiBella, James A. Johnson
Publikováno v:
IEEE Transactions on Electron Devices. 63:174-181
A 47-million-pixel (47Mp) interline charge-coupled-device (CCD) image sensor, the world’s highest resolution interline-transfer CCD, has been developed for industrial, machine vision, and aerial photography applications. The sensor features a 5.5-
Autor:
James A. DiBella, Douglas A. Carpenter, Stephen L. Kosman, Eric J. Meisenzahl, James E. Doran, Robert P. Fabinski, John P. Mccarten
Publikováno v:
SPIE Proceedings.
This paper describes the design and performance of a new high-resolution 35 mm format CCD image sensor using an advanced 5.5 μm interline pixel. The pixels are arranged in a 6576 (H) × 4384 (V) format to support a 3:2 aspect ratio. This device is p
Autor:
Paul C. Horgan, James E. Doran
Publikováno v:
SAE Technical Paper Series.