Zobrazeno 1 - 1
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pro vyhledávání: '"James Derek Legg"'
Publikováno v:
SPIE Proceedings.
We report here on process integration issues in the interconnect module of advanced microprocessor. We show how stresses in certain layers can affect yield and result in novel failure mechanisms in other layers. The paper will follow the history of a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2fe0bc2a68eb7255a44ec0c7ecf420b3
https://doi.org/10.1117/12.324375
https://doi.org/10.1117/12.324375
