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Publikováno v:
2016 IEEE International Symposium on Phased Array Systems and Technology (PAST).
S-parameter measurements are used to obtain impedance mismatch and coupling loss of radiating elements embedded in an array configuration. This paper shows how the measurements can be used independently of element pattern measurements to estimate the
Autor:
James Bargeron, Ingrid St. Omer
Publikováno v:
IEEE Southeastcon 2009.
The manipulation of individual nanostructures, regardless of their shape or medium, is a challenge for those seeking to efficiently utilize the electrical properties of those nanostructures [1]. In this study, two procedures were developed to observe