Zobrazeno 1 - 4
of 4
pro vyhledávání: '"James B. Mohr"'
Publikováno v:
Surface Roughness and Scattering.
Optical scatter measurements from polysilicon surfaces were performed using 632.8 nm illumination at 45 degrees and 488 nm illumination at 76.8 degrees. Scatter was recorded up to 60 degrees from the specular beam. Results are compared with surface s
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ad636c557b3c5ef87b89e755b5879431
https://doi.org/10.1364/surs.1992.pd2
https://doi.org/10.1364/surs.1992.pd2
Publikováno v:
Applied Optics. 32:3377
Optical-scatter measurements from polysilicon and aluminum surfaces were performed by using 632.8-nm illumination at 45 deg and 488-nm illumination at 76.8 deg. Scatter was recorded up to 60 deg from the specular beam by using a concentric ring photo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2e8d91a1394f38a3310e77bd3930acb3
https://doi.org/10.1364/ao.32.003377
https://doi.org/10.1364/ao.32.003377
Publikováno v:
Court Review. 2009, Vol. 45 Issue 1/2, p20-25. 6p.
Autor:
K.L. Mittal
This volume chronicles the proceedings of the Third Symposium on Particles on Surfaces : Detection, Adhesion and Removal held as a part of the 21st Annual Meeting of the Fine Particle Society in San Diego, California, August 21 - 25, 1990. The first
