Zobrazeno 1 - 10
of 73
pro vyhledávání: '"James, D.T."'
Publikováno v:
Supply Chain Management: An International Journal, 2017, Vol. 22, Issue 2, pp. 107-121.
Externí odkaz:
http://www.emeraldinsight.com/doi/10.1108/SCM-01-2017-0008
Autor:
Qui, Yun, Tannock, James D.T.
Publikováno v:
International Journal of Quality & Reliability Management, 2010, Vol. 27, Issue 9, pp. 1067-1081.
Externí odkaz:
http://www.emeraldinsight.com/doi/10.1108/02656711011084846
Publikováno v:
International Journal of Quality & Reliability Management, 2008, Vol. 25, Issue 4, pp. 366-382.
Externí odkaz:
http://www.emeraldinsight.com/doi/10.1108/02656710810865258
Publikováno v:
Journal of Manufacturing Technology Management, 2007, Vol. 18, Issue 5, pp. 561-575.
Externí odkaz:
http://www.emeraldinsight.com/doi/10.1108/17410380710752662
Publikováno v:
International Journal of Quality & Reliability Management, 2005, Vol. 22, Issue 5, pp. 485-502.
Externí odkaz:
http://www.emeraldinsight.com/doi/10.1108/02656710510598393
Publikováno v:
International Journal of Quality & Reliability Management, 1999, Vol. 16, Issue 5, pp. 418-432.
Externí odkaz:
http://www.emeraldinsight.com/doi/10.1108/02656719910248217
Autor:
Tannock, James D.T.
Publikováno v:
International Journal of Quality & Reliability Management, 1997, Vol. 14, Issue 7, pp. 687-699.
Externí odkaz:
http://www.emeraldinsight.com/doi/10.1108/02656719710173267
Autor:
Tannock, James D.T.
Publikováno v:
International Journal of Quality & Reliability Management, 1995, Vol. 12, Issue 5, pp. 75-84.
Externí odkaz:
http://www.emeraldinsight.com/doi/10.1108/02656719510090018
Autor:
James D.T. Tannock
Publikováno v:
International Journal of Quality & Reliability Management. 12:75-84
The effects of the choice of inspection level are poorly understood by many manufacturing companies and frequently result in waste or customer dissatisfaction. Describes the use of a quality simulation technique to generate cost data related to manuf
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fe2212e2e66d07ac561f2eaec93a620a
https://doi.org/10.1108/02656719510090018
https://doi.org/10.1108/02656719510090018
Autor:
James, D.T., Kjellander, B.K.C., Smaal, W.T.T., Gelinck, G.H., Combe, C., McCulloch, I., Wilson, R., Burroughes, J.H., Bradley, D.D.C., Kim, J.S.
Publikováno v:
ACS Nano, 12, 5, 9824-9835
We report thin-film morphology studies of inkjet-printed single-droplet organic thin-film transistors (OTFTs) using angle-dependent polarized Raman spectroscopy. We show this to be an effective technique to determine the degree of molecular order as
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::609d7172b055549fc2c1613ce7a48a4d
http://resolver.tudelft.nl/uuid:f3d42dd9-8f90-447d-83dc-5b621d69a97e
http://resolver.tudelft.nl/uuid:f3d42dd9-8f90-447d-83dc-5b621d69a97e
