Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Jambreck, Joachim D."'
Autor:
Rommel, Mathias, Jambreck, Joachim D., Lemberger, Martin, Bauer, Anton J., Frey, Lothar, Murakami, Katsuhisa, Richter, Christoph, Weinzierl, Philipp
Using conductive atomic force microscopy (cAFM), I-V characteristics on dot-like areas can be acquired to study current conduction mechanisms or dielectric breakdown statistics on the nanoscale. However, today such I-V measurements exhibit relatively
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od_______610::d221d4c4c2f52c28fcfbf88006c4b13b
https://publica.fraunhofer.de/handle/publica/231563
https://publica.fraunhofer.de/handle/publica/231563
Autor:
Jambreck, Joachim D., Böhmler, Miriam, Rommel, Mathias, Hartschuh, Achim, Bauer, Anton J., Frey, Lothar
Publikováno v:
Proceedings of SPIE; September 2011, Vol. 8105 Issue: 1 p81050G-81050G-9, 729460p
