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pro vyhledávání: '"Jakob Michl"'
Autor:
Christian Schleich, Dominic Waldhor, Theresia Knobloch, Weifeng Zhou, Bernhard Stampfer, Jakob Michl, Michael Waltl, Tibor Grasser
Publikováno v:
IEEE Transactions on Electron Devices. 69:4479-4485
Autor:
Dominic Waldhoer, Christian Schleich, Jakob Michl, Alexander Grill, Dieter Claes, Alexander Karl, Theresia Knobloch, Gerhard Rzepa, Jacopo Franco, Ben Kaczer, Michael Waltl, Tibor Grasser
Charge trapping plays an important role for the reliability of electronic devices and manifests itself in various phenomena like bias temperature instability (BTI), random telegraph noise (RTN), hysteresis or trap-assisted tunneling (TAT). In this wo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d19794c155611d9731c6fa4c1278ab9f
Autor:
Konstantinos Tselios, Jakob Michl, Theresia Knobloch, Hubert Enichlmair, Eleftherios G. Ioannidis, Rainer Minixhofer, Tibor Grasser, Michael Waltl
Publikováno v:
Microelectronics Reliability. 138:114701
Publikováno v:
The Journal of chemical physics. 151(10)
We computed the phase diagram of CO
Publikováno v:
The journal of chemical physics 151(10), 104502-(2019). doi:10.1063/1.5116540
We computed the phase diagram of CO2 hydrates at high pressure (HP), from 0.3 to 20 kbar, by means of molecular dynamics simulations. The two CO2 hydrates known to occur in this pressure range are the cubic structure I (sI) clathrate and the HP hydra
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::90ea9e6883ba8fb4eba6ba3a1434f6c0
https://juser.fz-juelich.de/record/866384
https://juser.fz-juelich.de/record/866384