Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Jais Abraham"'
Autor:
Ankush Srivastava, Jais Abraham
Publikováno v:
2022 IEEE International Test Conference (ITC).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a90dac9e48889649a227fc71a9bbbd59
https://doi.org/10.1109/itc50671.2022.00052
https://doi.org/10.1109/itc50671.2022.00052
Autor:
Martin Keim, Glenn Colon-Bonet, Uttam Garg, Jais Abraham, Chennian Di, Ramesh C. Sharma, Benoit Nadeau-Dostie, Etienne Racine
Publikováno v:
ITC-Asia
Content Addressable Memories (CAMs) have found widespread use in applications that require high speed search capabilities. Each cell in the CAM array is associated with a storage unit and a comparator logic. Due to the various customized features in
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2ffb954df19068284f7c9b2cd83a63d1
https://doi.org/10.1109/itc-asia.2017.8097123
https://doi.org/10.1109/itc-asia.2017.8097123
Publikováno v:
VLSI Design
Scan Compression design solutions integrated into an SoC offers tradeoffs between reduction of test time and test data volume based on the allocation of tester channels amongst various IPs. This paper presents a heuristic to provide significant test
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::74457388e57d8e6910fbd1f0bfec21f9
https://doi.org/10.1109/vlsid.2016.99
https://doi.org/10.1109/vlsid.2016.99
Publikováno v:
20th International Conference on VLSI Design held jointly with 6th International Conference on Embedded Systems (VLSID'07); 2007, p339-344, 6p
Conference
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