Zobrazeno 1 - 10
of 24
pro vyhledávání: '"Jaimal Williamson"'
Publikováno v:
IMAPSource Proceedings. 2022
Board level reliability (BLR) temperature cycling is a metric for FCBGA field performance, where it is imperative to understand process variation holistically covering both substrate and / or assembly manufacturing process and its impact to product m
Publikováno v:
ASME 2022 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems.
Modern computing platforms used in data centers or harsh environment platforms would be exposed to sustained high temperatures over an extended period of time. Thermal interface materials are extensively used to transport heat from the die surfaces t
Publikováno v:
ASME 2022 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems.
Underhood applications in automotive are increasingly using electronics systems for safety and critical functions. In flip-chip ball grid array (FCBGA) packages, underfill (UF) forms the integral mechanical support between the substrate and die. In a
Publikováno v:
IEEE Transactions on Components, Packaging and Manufacturing Technology. 11:589-597
In modern integrated circuit (IC) packaging, it is difficult to perceive and evaluate the quality of the solder ball interconnections due to their complex hidden physical configuration and miniaturization. Laser ultrasonic inspection (LUI) technique
Autor:
Jaimal Williamson, Jeffrey C. Suhling, Yunli Zhang, Edward W. Davis, Pradeep Lall, Haotian Wu
Publikováno v:
ASME 2021 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems.
Much of the electronics used to support power systems and enable safety systems resides underhood where operating temperatures are much higher than in traditional consumer applications. Underhood electronics may be subjected to sustained high tempera
Publikováno v:
Journal of Electronic Packaging. 144
Laser ultrasonic inspection (LUI) is a nondestructive and noncontact technique to evaluate the quality of solder ball interconnections in area-array micro-electronic packages. Dual-Fiber Array Laser Ultrasonic Inspection System was demonstrated ident
Publikováno v:
2021 20th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (iTherm).
Publikováno v:
2021 20th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (iTherm).
Thermo-mechanical reliability of Flip Chip Ball Grid Arrays in automotive underhood environments has received a lot of attention owing the emergence of new application in advanced driver assist systems including guidance, navigation and control. The
Publikováno v:
2021 20th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (iTherm).
FCBGAs are finding applications in automotive underhood environments where they may be subjected to sustained temperatures of 125-200°C for sustained periods during operation. While, FCGBAs have been previously used in consumer applications where op
Publikováno v:
ASME 2020 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems.
Flip-Chip Ball Grid Arrays (FCBGAs) are finding applications in automotive underhood electronics for enablement of safety-critical functions. Underfills needed to reinforce flip-chip interconnects in FCBGAs need to operate reliably under sustained hi