Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Jaeyoun Youn"'
Autor:
Yesin Ryu, Sung-Gi Ahn, Jae Hoon Lee, Jaewon Park, Yong Ki Kim, Hyochang Kim, Yeong Geol Song, Han-Won Cho, Sunghye Cho, Seung Ho Song, Haesuk Lee, Useung Shin, Jonghyun Ahn, Je-Min Ryu, Sukhan Lee, Kyoung-Hwan Lim, Jungyu Lee, Jeong Hoan Park, Jae-Seung Jeong, Sunghwan Joo, Dajung Cho, So Young Kim, Minsu Lee, Hyunho Kim, Minhwan Kim, Jae-San Kim, Jinah Kim, Hyun Gil Kang, Myung-Kyu Lee, Sung-Rae Kim, Young-Cheon Kwon, Young Yong Byun, Kijun Lee, Sangkil Park, Jaeyoun Youn, Myeong-O Kim, Kyomin Sohn, Sang-Joon Hwang, Jooyoung Lee
Publikováno v:
IEEE Journal of Solid-State Circuits. 58:1051-1061
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9c80db8e5f79af25b48cddf42ba40bee
https://doi.org/10.1109/jssc.2022.3232096
https://doi.org/10.1109/jssc.2022.3232096
Autor:
Yesin Ryu, Young-Cheon Kwon, Jae Hoon Lee, Sung-Gi Ahn, Jaewon Park, Kijun Lee, Yu Ho Choi, Han-Won Cho, Jae San Kim, Jungyu Lee, Haesuk Lee, Seung Ho Song, Je Min Ryu, Yeong Ho Yun, Useung Shin, Dajung Cho, Jeong Hoan Park, Jae-Seung Jeong, Sukhan Lee, Kyoung-Hwan Lim, Tae-Sung Kim, Kyungmin Kim, Yu Jin Cha, Ik Joo Lee, Tae Kyu Byun, Han Sik Yoo, Yeong Geol Song, Myung-Kyu Lee, Sunghye Cho, Sung-Rae Kim, Ji-Min Choi, Hyoung Min Kim, Soo Young Kim, Jaeyoun Youn, Myeong-O Kim, Kyomin Sohn, SangJoon Hwang, JooYoung Lee
Publikováno v:
2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::00a99a13ae901f43741fcb5c71c87960
https://doi.org/10.1109/vlsitechnologyandcir46769.2022.9830391
https://doi.org/10.1109/vlsitechnologyandcir46769.2022.9830391
Autor:
Bae, Yong-Cheol, Park, Joon-Young, Rhee, Sang Jae, Ko, Seung Bum, Jeong, Yonggwon, Noh, Kwang-Sook, Son, Younghoon, Youn, Jaeyoun, Chu, Yonggyu, Cho, Hyunyoon, Kim, Mijo, Yim, Daesik, Kim, Hyo-Chang, Jung, Sang-Hoon, Choi, Hye-In, Yim, Sungmin, Lee, Jung-Bae, Choi, Joo Sun, Oh, Kyungseok
Publikováno v:
2012 IEEE International Solid-State Circuits Conference; 1/ 1/2012, p44-46, 3p