Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Jaesung Roh"'
Publikováno v:
Materials Chemistry and Physics. 136:577-581
We investigated the structural and magnetic properties of Co2MnSi deposited on Co90Fe10 and Co50Fe50 ferromagnetic seed-layers at room temperature before and after annealing at various temperatures up to 500 °C. The lattice misfits between Co2MnSi a
Autor:
Minsuk Lee, Sanghoon Cho, Bokyong Jung, Changhyup Shin, Minki Choi, Giljoo Song, Jaesung Roh, Sungki Park, Won-Jong Lee
Publikováno v:
ECS Meeting Abstracts. :2027-2027
not Available.
Autor:
Hyejung Choi, Jaeyun Yi, Sangmin Hwang, Sangkeum Lee, Seokpyo Song, Seunghwan Lee, Jaeyeon Lee, Donghee Son, Jinwon Park, Suk-Ju Kim, Ja-Yong Kim, Sunghoon Lee, Jiwon Moon, Choidong Kim, Jungwoo Park, Moonsig Joo, JaeSung Roh, Sungki Park, Sung-Woong Chung, Junghoon Rhee
Publikováno v:
2011 3rd IEEE International Memory Workshop (IMW); 2011, p1-4, 4p
Autor:
Jung-Ho Lee, Jeongyoub Lee, Somit Talwar, Yun Wang, Daehee Weon, Seungho Hahn, Changyong Kang, Taeeun Hong, Younggwan Kim, Haewang Lee, Seokkiu Lee, Jaesung Roh, Daegwan Kang, Jinwon Park
Publikováno v:
International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138); 2000, p441-444, 4p
Autor:
Jaeyun Yi, Hyejung Choi, Seokpyo Song, Donghee Son, Sangkeum Lee, Jinwon Park, Wangee Kim, Mingyu Sung, Sunghoon Lee, Jiwon Moon, Choidong Kim, Jungwoo Park, Moonsig Joo, JaeSung Roh, Sungki Park, Sung-Woong Chung, Jaegoan Jeong, Sung-Joo Hong, Sung-Wook Park
Publikováno v:
2011 International Symposium on VLSI Technology, Systems & Applications (VLSI-TSA); 2011, p1-2, 2p
Autor:
Jaeyun Yi, Hyejung Choi, Seunghwan Lee, Jaeyeon Lee, Donghee Son, Sangkeum Lee, Sangmin Hwang, Seokpyo Song, Jinwon Park, Sookjoo Kim, Wangee Kim, Ja-Yong Kim, Sunghoon Lee, Jiwon Moon, Jinju You, Moonsig Joo, JaeSung Roh, Sungki Park, Sung-Woong Chung, Junghoon Lee
Publikováno v:
2011 Symposium on VLSI Technology (VLSIT); 2011, p48-49, 2p
Autor:
Hyunpil Noh, Suock Jeong, Seongjoon Lee, Yousung Kim, Woncheol Cho, Min Huh, Gucheol Jeong, Jaebuhm Suh, Hoyeop Kweon, Jaesung Roh, Kisoo Shin, Sangdon Lee
Publikováno v:
2002 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.01CH37303); 2002, p56-57, 2p