Zobrazeno 1 - 10
of 28
pro vyhledávání: '"Jaeseok Bae"'
Publikováno v:
Scientific Reports, Vol 8, Iss 1, Pp 1-9 (2018)
Abstract Smart devices have been fabricated based on design concept of multiple layer structures which require through silicon vias to transfer electric signals between stacked layers. Because even a single defect leads to fail of the packaged device
Externí odkaz:
https://doaj.org/article/f47fd52793a441f998c37807c90ec457
Publikováno v:
Optical Manufacturing and Testing XIV.
Publikováno v:
Metrologia. 60:025007
Multilayer thin-film structures are widely used for many different types of devices in the semiconductor, display, and battery manufacturing industries. In such devices, the thickness of each layer should be strictly controlled to meet desired perfor
Publikováno v:
International Journal of Precision Engineering and Manufacturing. 20:463-477
Thickness is a typical parameter related to length, of which measurements are conducted in various industrial fields, such as the automotive, aviation, ship-building, semiconductor, and display industries. Among various measurement techniques, optica
Publikováno v:
Optics Communications. 431:181-186
A non-destructive method for measuring the physical thickness and group refractive index of individual layers was proposed based on spectral-domain interferometry, which was realized to achieve real-time measurements using a mode-locked laser and an
Publikováno v:
Scientific Reports, Vol 8, Iss 1, Pp 1-9 (2018)
Scientific Reports
Scientific Reports
Smart devices have been fabricated based on design concept of multiple layer structures which require through silicon vias to transfer electric signals between stacked layers. Because even a single defect leads to fail of the packaged devices, the di
Publikováno v:
Optics Express. 29:31615
In this study, an optical method that allows simultaneous thickness measurements of two different layers distributed over a broad thickness range from several tens of nanometers to a few millimeters based on the integration of a spectroscopic reflect
Publikováno v:
Metrologia. 58:054002
Autor:
Duk-Woo Park, Jung-Min Ahn, Jae-Kwan Song, Jong-Min Song, Jaeseok Bae, Ran Heo, Duk-Hyun Kang, Dae-Hee Kim, Sahmin Lee, Min Soo Cho, Jeong Yoon Jang, Jung Ae Hong
Publikováno v:
European Heart Journal - Cardiovascular Imaging. 19:684-689
Aims Using balloon sizing to determine device size may cause complications and increase procedure time in performing transcatheter closure of atrial septal defect (ASD). We aimed to validate the clinical utility of a formula using measurements from 3
Publikováno v:
Optical Measurement Systems for Industrial Inspection XI.
The optical interferometry is a non-contact dimensional measurement technique which is capable of ultra-high-precision measurements. Fundamentally, it provides the optical path difference instead of the geometrical path difference. For thickness meas