Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Jae-San Kim"'
Autor:
Yesin Ryu, Sung-Gi Ahn, Jae Hoon Lee, Jaewon Park, Yong Ki Kim, Hyochang Kim, Yeong Geol Song, Han-Won Cho, Sunghye Cho, Seung Ho Song, Haesuk Lee, Useung Shin, Jonghyun Ahn, Je-Min Ryu, Sukhan Lee, Kyoung-Hwan Lim, Jungyu Lee, Jeong Hoan Park, Jae-Seung Jeong, Sunghwan Joo, Dajung Cho, So Young Kim, Minsu Lee, Hyunho Kim, Minhwan Kim, Jae-San Kim, Jinah Kim, Hyun Gil Kang, Myung-Kyu Lee, Sung-Rae Kim, Young-Cheon Kwon, Young Yong Byun, Kijun Lee, Sangkil Park, Jaeyoun Youn, Myeong-O Kim, Kyomin Sohn, Sang-Joon Hwang, Jooyoung Lee
Publikováno v:
IEEE Journal of Solid-State Circuits. 58:1051-1061
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9c80db8e5f79af25b48cddf42ba40bee
https://doi.org/10.1109/jssc.2022.3232096
https://doi.org/10.1109/jssc.2022.3232096
Autor:
Yesin Ryu, Young-Cheon Kwon, Jae Hoon Lee, Sung-Gi Ahn, Jaewon Park, Kijun Lee, Yu Ho Choi, Han-Won Cho, Jae San Kim, Jungyu Lee, Haesuk Lee, Seung Ho Song, Je Min Ryu, Yeong Ho Yun, Useung Shin, Dajung Cho, Jeong Hoan Park, Jae-Seung Jeong, Sukhan Lee, Kyoung-Hwan Lim, Tae-Sung Kim, Kyungmin Kim, Yu Jin Cha, Ik Joo Lee, Tae Kyu Byun, Han Sik Yoo, Yeong Geol Song, Myung-Kyu Lee, Sunghye Cho, Sung-Rae Kim, Ji-Min Choi, Hyoung Min Kim, Soo Young Kim, Jaeyoun Youn, Myeong-O Kim, Kyomin Sohn, SangJoon Hwang, JooYoung Lee
Publikováno v:
2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::00a99a13ae901f43741fcb5c71c87960
https://doi.org/10.1109/vlsitechnologyandcir46769.2022.9830391
https://doi.org/10.1109/vlsitechnologyandcir46769.2022.9830391
Autor:
Jae-San Kim, Joon-Sung Yang
Publikováno v:
DAC
Various studies have been carried out to improve the operational efficiency of the Deep Neural Networks (DNNs). However, the importance of the reliability in DNNs has generally been overlooked. As the underlying semiconductor technology decreases in
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ef07c71b31a6cfc3bd5720b91a9ba704
https://doi.org/10.1145/3316781.3317805
https://doi.org/10.1145/3316781.3317805
Autor:
Jae-San Kim, Joon-Sung Yang
Publikováno v:
DAC: Annual ACM/IEEE Design Automation Conference; 2019, Issue 56, p397-402, 6p