Zobrazeno 1 - 9
of 9
pro vyhledávání: '"Jacobs, Ralf T."'
Autor:
Jacobs, Ralf T., Kost, Arnulf
Publikováno v:
COMPEL -The international journal for computation and mathematics in electrical and electronic engineering, 2020, Vol. 39, Issue 3, pp. 709-723.
Publikováno v:
COMPEL -The international journal for computation and mathematics in electrical and electronic engineering, 2018, Vol. 37, Issue 4, pp. 1366-1375.
Publikováno v:
COMPEL -The international journal for computation and mathematics in electrical and electronic engineering, 2008, Vol. 27, Issue 1, pp. 110-121.
Externí odkaz:
http://www.emeraldinsight.com/doi/10.1108/03321640810836681
Reverberation chambers show transient behaviour when excited with a pulsed signal. The field intensities can in this case be significantly higher than in steady state, which implies that a transient field can exceed predefined limits and render test
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=copernicuspu::c4e309ffcdd5bba12fdab92e299ab0ef
https://ars.copernicus.org/articles/18/53/2020/
https://ars.copernicus.org/articles/18/53/2020/
A full wave description of a thin wire structure, that includes mutual interactions and radiation, can be obtained in closed form with the so-called Transmission Line Super Theory or a refined variant of this method that utilises perturbation theory.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=copernicuspu::b1c3d880f5d099aacab604f5e005ff40
https://www.adv-radio-sci.net/16/123/2018/
https://www.adv-radio-sci.net/16/123/2018/
Akademický článek
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.
Publikováno v:
Advances in Radio Science; 2018, Vol. 16, p123-133, 11p
Autor:
Wondrak, Thomas, Ratajczak, Matthias, Gundrum, Thomas, Stefani, Frank, Krauthauser, Hans Georg, Jacobs, Ralf T.
Publikováno v:
2015 IEEE International Symposium on Electromagnetic Compatibility (EMC); 2015, p306-311, 6p
Publikováno v:
Microwave & Optical Technology Letters; 9/5/99, Vol. 22 Issue 5, p317-321, 5p, 2 Diagrams, 5 Graphs