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Autor:
van Driel, W.D., Jacobs, B.M.M., Onushkin, G., Watte, P., ZHAO, X., Davis, J. Lynn, van Driel, Willem Dirk, Mehr, Maryam Yazdan Mehr
Publikováno v:
Reliability of Organic Compounds in Microelectronics and Optoelectronics ISBN: 9783030815752
Reliability of Organic Compounds in Microelectronics and Optoelectronics
Reliability of Organic Compounds in Microelectronics and Optoelectronics: From Physics-of-Failure to Physics-of-Degradation
Reliability of Organic Compounds in Microelectronics and Optoelectronics
Reliability of Organic Compounds in Microelectronics and Optoelectronics: From Physics-of-Failure to Physics-of-Degradation
Reliability is an essential scientific and technological domain intrinsically linked with system integration. Nowadays, semiconductor industries are confronted with ever-increasing design complexity, dramatically decreasing design margins, increasing
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6adc8a31e1fcb2dcf8ddb3f3790abfbc
https://doi.org/10.1007/978-3-030-81576-9_7
https://doi.org/10.1007/978-3-030-81576-9_7