Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Jacobs, B.M.M."'
Autor:
van Driel, W.D., Jacobs, B.M.M., Onushkin, G., Watte, P., ZHAO, X., Davis, J. Lynn, van Driel, Willem Dirk, Mehr, Maryam Yazdan Mehr
Publikováno v:
Reliability of Organic Compounds in Microelectronics and Optoelectronics ISBN: 9783030815752
Reliability of Organic Compounds in Microelectronics and Optoelectronics
Reliability of Organic Compounds in Microelectronics and Optoelectronics: From Physics-of-Failure to Physics-of-Degradation
Reliability of Organic Compounds in Microelectronics and Optoelectronics
Reliability of Organic Compounds in Microelectronics and Optoelectronics: From Physics-of-Failure to Physics-of-Degradation
Reliability is an essential scientific and technological domain intrinsically linked with system integration. Nowadays, semiconductor industries are confronted with ever-increasing design complexity, dramatically decreasing design margins, increasing
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6adc8a31e1fcb2dcf8ddb3f3790abfbc
https://doi.org/10.1007/978-3-030-81576-9_7
https://doi.org/10.1007/978-3-030-81576-9_7
Autor:
Masson, V.1, Le Moigne, P.1, Martin, E.1 eric.martin@meteo.fr, Faroux, S.1, Alias, A.1, Alkama, R.1, Belamari, S.1, Barbu, A.1, Boone, A.1, Bouyssel, F.1, Brousseau, P.1, Brun, E.1, Calvet, J.-C.1, Carrer, D.1, Decharme, B.1, Delire, C.1, Donier, S.1, Essaouini, K.2, Gibelin, A.-L.1,3, Giordani, H.1
Publikováno v:
Geoscientific Model Development Discussions. 2012, Vol. 5 Issue 4, p3771-3851. 307p. 28 Diagrams, 39 Charts, 25 Graphs, 1 Map.
