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pro vyhledávání: '"Jacob J. Orbon"'
Autor:
Jacob J. Orbon
Publikováno v:
2016 27th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC).
This paper describe the detection of visible and non-visible defects in 3DIC flows. These new flows have process modules that have been used before in CMOS wafer fabrication. There are opportunities to create latent defects such as via voids or thin
Publikováno v:
2009 IEEE/SEMI Advanced Semiconductor Manufacturing Conference.
At-speed Logic BIST(Built-In Self-Test) has been embedded to the latest Cisco ASICs (Application Specific Integrated Circuit) and the test can be run on ATE (Automatic Test Equipment) at probe and final test, as well as in-system during diagnostics,
Autor:
Jacob J. Orbon, Ofer Bokobza, Jim Jensen, Lior Levin, Brian Zhang, Manjari Dutta, Dennis Ciplickas, Teri Pham, Rinat Shimshi
Publikováno v:
SPIE Proceedings.
Challenges of the new nanometer processes have complicated the yield enhancement process. The systematic yield loss component is increasing, due to the complexity and density of the new processes and the designs that are developed for them. High prod