Zobrazeno 1 - 10
of 13
pro vyhledávání: '"Jaap Kautz"'
Publikováno v:
Ultramicroscopy. 183:8-14
In a lot of systems, charge transport is governed by local features rather than being a global property as suggested by extracting a single resistance value. Consequently, techniques that resolve local structure in the electronic potential are crucia
Publikováno v:
Surface Science. 632:L18-L21
We study the differential reactivity of alkanethiols with submonolayers of Au on Si(111), where the surface is a mixture of the Au-rich 3 × 3 structure and the Au-poor 5 × 2 structure. We expose these binary 2D alloy samples to alkanethiols, while
Publikováno v:
Ultramicroscopy, 181, 74-80
Ultramicroscopy
Ultramicroscopy
In a lot of systems, charge transport is governed by local features rather than being a global property as suggested by extracting a single resistance value. Consequently, techniques that resolve local structure in the electronic potential are crucia
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::246178bd892ee61de775c399f8f762f8
http://hdl.handle.net/1887/77990
http://hdl.handle.net/1887/77990
Autor:
Jaap Kautz
Publikováno v:
Casimir PhD Series
Jaap Kautz
Jaap Kautz
Low Energy Electron Microscopy (LEEM) is a microscopy technique typically used to study surface processes. The sample is illuminated with a parallel beam of electrons under normal incidence and the reflected electrons are projected onto a pixelated d
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::30fdd098797dd38d5e99397119c60419
https://hdl.handle.net/1887/32852
https://hdl.handle.net/1887/32852
Publikováno v:
Nature Communications
NATURE COMMUNICATIONS, 6, 8926
NATURE COMMUNICATIONS
NATURE COMMUNICATIONS, 6, 8926
NATURE COMMUNICATIONS
The properties of any material are fundamentally determined by its electronic band structure. Each band represents a series of allowed states inside a material, relating electron energy and momentum. The occupied bands, that is, the filled electron s
Autor:
Heiko B. Weber, S. J. van der Molen, Johannes Jobst, Christian Sorger, Jaap Kautz, Rudolf M. Tromp
Publikováno v:
SCIENTIFIC REPORTS
Scientific Reports
SCIENTIFIC REPORTS, 5, 13604
Scientific Reports
SCIENTIFIC REPORTS, 5, 13604
Charge transport measurements form an essential tool in condensed matter physics. The usual approach is to contact a sample by two or four probes, measure the resistance and derive the resistivity, assuming homogeneity within the sample. A more thoro
Publikováno v:
Physical Review B : Condensed Matter, 89(3), 035416
Physical Review B : Condensed Matter
Physical Review B : Condensed Matter
We study and analyze the growth of submonolayers of Au on Si(111) by a complementary set of surface techniques. Specifically, we focus on the $5\ifmmode\times\else\texttimes\fi{}2$ and the $\ensuremath{\alpha}\sqrt{3}\ifmmode\times\else\texttimes\fi{
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b45a3bee17b10b9a66e3f722b212dc86
http://hdl.handle.net/1887/51888
http://hdl.handle.net/1887/51888
Autor:
Guus Rijnders, Mark Huijben, Arturas Vailionis, Hans Boschker, Jaap Kautz, Gertjan Koster, David H.A. Blank, Evert Pieter Houwman, Wolter Siemons
Publikováno v:
Physical Review Letters. 109
We present a study of the thickness dependence of magnetism and electrical conductivity in ultrathin La0.67Sr0.33MnO3 films grown on SrTiO3 (110) substrates. We found a critical thickness of 10 unit cells below which the conductivity of the films dis
Autor:
Hans, Boschker, Jaap, Kautz, Evert P, Houwman, Wolter, Siemons, Dave H A, Blank, Mark, Huijben, Gertjan, Koster, Arturas, Vailionis, Guus, Rijnders
Publikováno v:
Physical review letters. 109(15)
We present a study of the thickness dependence of magnetism and electrical conductivity in ultrathin La0.67Sr0.33MnO3 films grown on SrTiO3 (110) substrates. We found a critical thickness of 10 unit cells below which the conductivity of the films dis
Publikováno v:
IBM Journal of Research and Development. 55:1:1-1:7
We describe the layout and the capabilities of a new aberration-corrected low-energy electron microscopy (LEEM) and photoemission electron microscopy (PEEM) facility, which features real- and reciprocal-space spectroscopy. This new setup, named Elect