Výsledky vyhledávání - "J.T. Armstrong"

Stellar Masses from Double Star Observations with the Mark III Interferometer

Autor: J.T. Armstrong

Publikováno v: International Astronomical Union Colloquium. 135:492-501

By improving on the angular resolution possible with conventional telescopes, speckle interferometry has been adding to the list of known masses, resolving binaries with separations of 30 mas. Interferometry with separate apertures offers the possibi

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::ec99e4354ac3f0566f20fdd7e24fbf7d
https://doi.org/10.1017/s0252921100007016

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Mk III Interferometer: Milliarcsecond 'Visual' Orbits of Spectroscopic Binaries

Autor: C.A. Hummel, J.T. Armstrong

Publikováno v: Symposium - International Astronomical Union. 158:410-412

The spectroscopic binary observing program of the Mark III Optical Interferometer has produced four published orbits and 22 preliminary orbits. The mean (formal) precision is 0.3% for measurements of sin i and 0.7% for measurements of the semimajor a

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::0c7773171a82e8457749464a1f7e9bf4
https://doi.org/10.1017/s0074180900108071

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Optical and structural studies of compositional inhomogeneity in strain-relaxed indium gallium nitride films

Autor: R.B. Marinenko, S. M. Bedair, N.A. El-Masry, John C. Roberts, Lawrence H. Robins, Edwin L. Piner, J.C. Woicik, K.E. Miyano, Albert J. Paul, C. A. Parker, S.M. Donovan, Stephen J. Pearton, W. R. Thurber, C. E. Bouldin, Mark D. Vaudin, M.J. Reed, J.T. Armstrong

Publikováno v: 2000 IEEE International Symposium on Compound Semiconductors. Proceedings of the IEEE Twenty-Seventh International Symposium on Compound Semiconductors (Cat. No.00TH8498).

The structural and optical properties of indium gallium nitride (In/sub x/Ga/sub 1-x/N) films with 0.04

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::16b4754d6d0ceb3c55d9bb3390698199
https://doi.org/10.1109/iscs.2000.947207

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AlGaAs composition measurements from in situ optical reflectance

Autor: P.M. Amirtharaj, L.H. Robins, J.G. Pellegrino, A.J. Paul, J.T. Armstrong, D. Chandler-Horowitz, R.B. Marinenko, K.A. Bertness

Publikováno v: 2000 Digest of the LEOS Summer Topical Meetings. Electronic-Enhanced Optics. Optical Sensing in Semiconductor Manufacturing. Electro-Optics in Space. Broadband Optical Networks (Cat. No.00TH8497).

We describe preliminary determinations of AlGaAs layer composition using in situ optical reflectance spectroscopy (ORS) data. RHEED oscillations are used to independently determine the composition of the AlGaAs layers. The results are compared with e

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::b923dca0a8c63a6a9d8eb9f4c6ff1765
https://doi.org/10.1109/leosst.2000.869715

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Quantitative particle analysis: fact or fiction

Autor: J.A. Small, J.T. Armstrong

Publikováno v: Proceedings, annual meeting, Electron Microscopy Society of America. 54:496-497

In conventional microprobe analysis, the samples and standards have a controlled geometry, i.e. flat polished, and infinitely large with respect to the electron beam interaction volume. As a result, the measured x-ray intensities for the analyzed ele

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::1ceab1e8e03b921d282d708e58514c15
https://doi.org/10.1017/s0424820100164945

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