Multiple response robust design and yield maximization

Autor: J.S.R. Jayaram, Yaacob Ibrahim

Publikováno v: International Journal of Quality & Reliability Management. 16:826-837

A design is robust if the design values for selected performance characteristics (i.e. responses) are chosen to be invariant to the variations the product will experience. For a design to be acceptable, it must conform to the design specifications. H

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::2511185f5713ebfa0ab06fed97cd162c
https://doi.org/10.1108/02656719910274308

Using dynamic reliability models to extend the economic life of strongly innovative products

Autor: D. Shangguan, R.A. Ion, Aarnout Brombacher, J.A. van den Bogaard, G. Hulsken, J.S.R. Jayaram

Publikováno v: Proceedings of the 2004 IEEE International Symposium on Electronics & the Environment, 220-225
STARTPAGE=220;ENDPAGE=225;TITLE=Proceedings of the 2004 IEEE International Symposium on Electronics & the Environment

This paper presents a concept that enables the modeling of the lifetime of products by using degradation analysis. With this model, the reliability characteristics of products can be predicted and the design of the products can be optimized for robus

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b2fefe35deee31cc8fd5314c893979d1
https://doi.org/10.1109/isee.2004.1299719

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