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Observation and analysis of self-amplified spontaneous emission at the APS low-energy undulator test line

Autor: Yuelin Li, Bingxin Yang, Efim Gluskin, W.G. Jansma, R.T. Keane, S. Xu, L. Morrison, B. Stejskal, D. Donkers, D. Meyer, D. Reigle, J. Attig, E.S. Lessner, F. Lenkszus, Kwang-Je Kim, J. Budz, William Berg, R.B. Zabel, W.R. Brzowski, R. Bechtold, G. Pile, John Power, K. Beczek, C. Benson, R. Ferry, G. Banks, T. Powers, M. Jaski, J. A. Biggs, R. Flood, S.J. Jones, K. Knoerzer, John Galayda, G.M. Markovich, C. Clark, J.H. Klick, R. Soliday, G.A. Sprau, G. Wiemerslage, V. Svirtun, Gil Travish, M. Erdmann, R.L. Gilmore, R.J. Dortwegt, J.C. Scapino, R. Hogrefe, R.A. Seglem, S. Labuda, K. Schroeder, J. Jagger, C.L. Doose, M. Knott, D. Ronzhin, Vadim Sajaev, Dean Walters, J.A. Torres, N.D. Arnold, M. W. Hahne, H. DeLeon, M. McDowell, J. Hoyt, S. Hanuska, Sang-Hoon Kim, J.R. Noonan, S. Christensen, T. Meier, Katherine Harkay, W. Michalek, A.L. Kelly, Michael Borland, A.J. Puttkammer, S. Berg, A. E. Grelick, J. Error, S.J. Pasky, D.L. Weyer, K. Boerste, Brian Tieman, Oleg Makarov, B. Deriy, W.P. McDowell, Alireza Nassiri, E. Theres, M. Bosek, J. Goetzen, S.J. Stein, Henry P. Freund, E. A. Crosbie, P. Castro, G.F. Trento, R. Gerig, W. Yoder, Sandra Biedron, Zhirong Huang, Emil Trakhtenberg, Yong-Chul Chae, J.M. Penicka, C. Gold, M.E. Conde, J.F. Sidarous, Robert Laird, E.R. Rotela, J.A. Carwardine, C.C. Putnam, Xuelong Wang, S. Sarkar, P.E. McNamara, G.A. Edwards, O. Singh, D. Wyncott, J. Warren, Y. I. Eidelman, J. Forrestal, R. Wright, T.L. Smith, A.J. Gorski, L. Reigle, R. Otto, C. Keyser, H. Friedsam, Wei Gai, L.C. Teng, Nicholas Sereno, A.F. Pietryla, Roger J. Dejus, G.A. Goeppner, K. Wilhelmi, M. Kirshenbaum, John W. Lewellen, Nikolay Vinokurov, S. Wesling, R.M. Lill, P.K. Den Hartog, K. Thompson, Sushil K. Sharma, P. Dombrowski, Alex H. Lumpkin, J. Pace, G. Harris, H. Moe, Stephen V. Milton, Ju Wang, Elizabeth Moog, Isaac Vasserman, A.L. Hillman, E.F. Russell, J. Gagliano, C. Pitts, J. Lang, R.J. Koldenhoven, J. Vacca, Glenn Decker, D. Dohan

Publikováno v: The Lens

Exponential growth of self-amplified spontaneous emission at 530 nm was first experimentally observed at the Advanced Photon Source low-energy undulator test line in December 1999. Since then, further detailed measurements and analysis of the results

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b1dfd758b4b869cc800b1b2e58455ed1
https://doi.org/10.1016/s0168-9002(01)01530-3

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Limitations in specular beam LEED analysis due to measurement of the scattering angle: Examples from a study of Cu(110)

Autor: J.R. Noonan, H.L. Davis

Publikováno v: Surface Science Letters. 99:L424-L428

The I–V profiles for specular LEED beams from a clean Cu(110) surface have been measured for three selected angles of incidence of the primary electron beam with respect to the crystal orientation. A comparison of experimental and calculated profil

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c670a8c51159a23f668599be80ca7535
https://doi.org/10.1016/0167-2584(80)90455-7

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Mixture of ordered domains in the NiAl(111) surface

Autor: H.L. Davis, J.R. Noonan

Publikováno v: Physical Review Letters. 59:1714-1717

The atomic structure of the NiAl(111) surface has been investigated through a LEED I-V analysis. In order to achieve a unique, consistent agreement between experimental and calculated I-V spectra, this surface is determined to be a 50-50 mixture of t

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4cf1132a210120617761853e95f34cd0
https://doi.org/10.1103/physrevlett.59.1714

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High sensitivity surface crystallography—illustrative Leed analyses of Cu(100) and Ag(110)

Autor: H.L. Davis, J.R. Noonan

Publikováno v: Vacuum. 32:107-112

Results obtained from studies of the Cu(100) and Ag(110) surfaces indicate that LEED structural analyses of clean metallic surfaces can be sensitive to changes on the order of 0.02 A in atomic spacing. This sensitivity was achieved by placing particu

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::0483667645d8fcbb98b8348112d001ee
https://doi.org/10.1016/s0042-207x(82)80006-7

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Calculational demonstration that averaging enhances data for use in a leed analysis

Autor: H.L. Davis, J.R. Noonan

Publikováno v: Surface Science Letters. 115:L75-L80

Representative LEED I - V profiles have been calculated corresponding to the incident beam slightly misaligned from, and exactly aligned with, the surface normal. It is demonstrated that the average profile, obtained by taking the mean of the { ij }

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::061eaf7f3bc04ed58a05eb1fd1d752bd
https://doi.org/10.1016/0167-2584(82)90531-x

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Truncation-induced relaxations of a high-index surface: Al(311)

Autor: J.R. Noonan, W. Erley, H.L. Davis

Publikováno v: Surface Science Letters. :A113

The atomic structure of the Al(311) surface has been determined using Low Energy Electron Diffraction (LEED). The surface unit cell was found to be in lateral registry with the bulk lattice. However, there are large vertical relaxations of the first

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8d9fd20e204da00acc5cfa6c48935aa0
https://doi.org/10.1016/0167-2584(85)90082-9

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