Zobrazeno 1 - 10
of 101
pro vyhledávání: '"J.P. Goudonnet"'
Publikováno v:
Thin Solid Films. 247:98-103
Scanning tunneling microscopy shows that the topographic image of a gold electrode sputtered on barium titanate exhibits a grain structure with a reproducible shape and size from one particle to the next. The tunneling spectroscopy imaging mode we ha
Autor:
T. David, J.P. Goudonnet
Publikováno v:
Thin Solid Films. 223:7-10
The sharpness of tips in scanning tunneling microscopy (STM) is a factor which affects the resolution of the STM image. In this paper we use a simple geometrical model to show how the dimer adatom stack-fault model of the Si(111)- 7×7 superficial re
Autor:
Alain Dereux, C. Girard, Eric Bourillot, Joachim R. Krenn, Jean-Claude Weeber, J.P. Goudonnet
Publikováno v:
Scopus-Elsevier
Publikováno v:
Chemical Physics Letters. 92:197-201
A simple experimental method for detecting organic species adsorbed on surfaces by surface-enhanced Raman scattering (SERS) is described. The rough silver surfaces were obtained by vapor deposition of Ag on teflon spheres of uniform size and shape on
Publikováno v:
Thin Solid Films. 82:89-95
We report the first measurements of the metal electroreflectance in the MIM structures Ag/Al 2 O 3 /Au,Au/Al 2 O 3 /Ag and Al/Al 2 O 3 /Ag. The results are consistent with the data obtained from electrolytic cells by other investigators. The electror
Publikováno v:
Thin Solid Films. 90:203-207
MIM electroreflectance data obtained with the symmetrical structures Al/Al2O3/Al, Au/Al2O3/Au and Au/ZnS/Au afford information about the metal-insulator interfaces. Al/Al2O3/Al gives no electroreflectance signal. Interpretation in terms of a change i
Publikováno v:
Thin Solid Films. 177:49-57
Optical absorbance measurements were obtained for silver particles formed on quartz substrates. From a model derived from Mie theory and taking into account the electromagnetic resonances for p (parallel) and s (perpendicular) polarizations, we descr
Publikováno v:
Optics Communications. 29:178-180
Discrepancies had been obtained for p polarization in the quantitative analysis of the photoemission yield of silver. They had been accounted in a semi-phenomenological way by introducing a “surface term”. It is shown here, that a non-local theor
Publikováno v:
Optics Communications. 1:391-393
The extraction depth of photoelectrons in thin films of amorphous germanium has been determined for λ = 2537 A by measuring the reflectivity, transmissibility and photoelectric yield for several incidences and polarization of light. The extraction d
Publikováno v:
Optical Interference Coatings.
A thin film embedded into a known stratified medium can be characterized by non destructive optical measurements. Transmittance and reflectance can be easily measured with s and p polarizations and several incidence angles. Light can enter into the m