Zobrazeno 1 - 10
of 54
pro vyhledávání: '"J.P. Dom"'
Publikováno v:
Microelectronics Reliability. 36:1859-1862
This paper presents a new method to isolate process steps causing performance spread of analogue or digital circuits. It is based on the analysis of process control (PC) parameters and can be directly applied to parametric on-wafer test. The suitabil
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::bc9d5e1eb49923c07e40a3c5d7e78e72
https://doi.org/10.1016/0026-2714(96)00215-6
https://doi.org/10.1016/0026-2714(96)00215-6
Publikováno v:
Proceedings Euro ASIC '92.
A powerful testing method consists in using two complementary techniques for ASIC's failure localization and analysis: external electrical testing and internal contactless laser beam testing. This method has been made possible using the CAD environme
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::dc50e101401f87eb9d68144447603863
https://doi.org/10.1109/euasic.1992.227987
https://doi.org/10.1109/euasic.1992.227987
Publikováno v:
Proceedings of the 1996 BIPOLAR/BiCMOS Circuits and Technology Meeting.
A simple DC method for integrated transistor base resistance extraction is described. Unlike other commonly-used DC methods, it does not need any knowledge about emitter or collector resistances. It is based on monitoring the substrate current of the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a0be23436d594718f71201cbcc13796b
https://doi.org/10.1109/bipol.1996.554622
https://doi.org/10.1109/bipol.1996.554622
Publikováno v:
Proceedings of Custom Integrated Circuits Conference.
A new strain gage bridge to PPM (Pulse Position Modulation) converter has been developed. It consists of a chopper amplifier and a voltage to time converter associated in a feed-back loop. This topology exhibits mainly an automatic offset cancellatio
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0b7c4e8c4fda5b115a0290c04d6a67f2
https://doi.org/10.1109/cicc.1996.510562
https://doi.org/10.1109/cicc.1996.510562
Publikováno v:
Digest of Papers 1996 IEEE International Workshop on IDDQ Testing.
The aim is the design of an I/sub DDX/ sensor integrated within the Circuit Under Test (CUT). Its function is transparent because its power consumption does not affect the behaviour of the CUT. This transducer is fast, accurate, linear and small for
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4b5cbc1f5b7778335b13aecc5cf87ad5
https://doi.org/10.1109/iddq.1996.557820
https://doi.org/10.1109/iddq.1996.557820
Publikováno v:
Proceedings of International Conference on Microelectronic Test Structures.
This paper describes a new methodology to extract active doping profiles in a bipolar technological process. Simulated device characteristics coming from a physical simulator are matched to electrical measurements following a straightforward procedur
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::057fd9caa24b750cdeb5ec67cbaa7757
https://doi.org/10.1109/icmts.1996.535662
https://doi.org/10.1109/icmts.1996.535662
Publikováno v:
Proceedings of the Fourth International Conference on Microelectronics for Neural Networks and Fuzzy Systems.
We developed an analog BiCMOS ASIC device modeling the electrical properties of biological neurons. The model parameters are variable, driven by specific inputs of the chip. We present here the first test results, and compare it to numerically-comput
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d7c646c2fecf0c236e4553422954abc1
https://doi.org/10.1109/icmnn.1994.593710
https://doi.org/10.1109/icmnn.1994.593710
Publikováno v:
1998 IEEE International Conference on Electronics, Circuits and Systems. Surfing the Waves of Science and Technology (Cat. No.98EX196).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::acc3f7066886ac25fa840ca4a73c7643
https://doi.org/10.1109/icecs.1998.814894
https://doi.org/10.1109/icecs.1998.814894
Publikováno v:
Digest of Papers IEEE International Workshop on IDDQ Testing.
A CMOS built-in current sensor is proposed. It is dedicated to mixed signal circuits power supply current monitoring. It takes advantage of a parasitic resistor, so its implementation is very transparent. Measurement results of a manufactured test ch
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::584503f332bdbeed5b1290b4d62648aa
https://doi.org/10.1109/iddq.1997.633019
https://doi.org/10.1109/iddq.1997.633019
Publikováno v:
ICNN
Our paper deals with an electronic full-custom circuit designed to accurately model the calcium dependence function of biological neurons. This ASIC is one in a set of modules dedicated for the analog modeling of neural networks and more specifically
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1224b9522be8b650e5c2298702506ca6
https://doi.org/10.1109/icnn.1997.616141
https://doi.org/10.1109/icnn.1997.616141