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pro vyhledávání: '"J.M. Saurel"'
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Publikováno v:
Journal of Nuclear Materials. 275:305-311
The investigation of nuclear fuel properties at high burnup often yields difficulties in accounting for the fuel pellet fragmentation, the sharp properties gradient accross the pellet radius and the troubles met in the surface preparation of such a m
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b6119ce682e565747cce044d1bacec84
https://doi.org/10.1016/s0022-3115(99)00128-2
https://doi.org/10.1016/s0022-3115(99)00128-2
Publikováno v:
The European Physical Journal Applied Physics. 2:209-222
L'etude de la signature acoustique permet de mesurer les vitesses de propagation des ondes acoustiques longitudinale et transverse dans les materiaux massifs, vitesses a partir desquelles on determine leurs proprietes mecaniques. Pour des materiaux e
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::395def9914f7e72db47af46237e86963
https://doi.org/10.1051/epjap:1998186
https://doi.org/10.1051/epjap:1998186
Publikováno v:
Journal of Non-Crystalline Solids. 209:273-282
A 590 MHz high frequency acoustic microscope has been used as a non-destructive local probe to measure the elastic properties of amorphous silicon carbide thin films supported as coatings on silicon substrates and as free-standing membranes. The film
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::86aaf12ac12a1c0ad37ba28c40e852fa
https://doi.org/10.1016/s0022-3093(96)00569-8
https://doi.org/10.1016/s0022-3093(96)00569-8
Publikováno v:
E-MRS Spring Conf.
E-MRS Spring Conf., 1994, Strasbourg, France
Thin Solid Films
Thin Solid Films, Elsevier, 1995, 255 (1-2), pp.155-158. ⟨10.1016/0040-6090(94)05643-R⟩
HAL
E-MRS Spring Conf., 1994, Strasbourg, France
Thin Solid Films
Thin Solid Films, Elsevier, 1995, 255 (1-2), pp.155-158. ⟨10.1016/0040-6090(94)05643-R⟩
HAL
Porous silicon (PS) layers were obtained from (100) p+-type silicon substrate of thickness 290 μm with a resistivity of (1–8) × 10 −2 Ω cm and porosity values ranging from 20% to 55%. Microacoustic techniques were performed to investigate the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::272a9c6aa9682502e337201170de4667
https://doi.org/10.1016/0040-6090(94)05643-r
https://doi.org/10.1016/0040-6090(94)05643-r
Autor:
Alain Foucaran, Y. Boumaiza, Thierry Taliercio, J.M. Saurel, R.J.M. da Fonseca, J. Camassel, E. Massone
Publikováno v:
Journal of Materials Science
Journal of Materials Science, Springer Verlag, 1995, 30 (1), pp.35-39. ⟨10.1007/BF00352128⟩
Journal of Materials Science, Springer Verlag, 1995, 30 (1), pp.35-39. ⟨10.1007/BF00352128⟩
Porous silicon (PS) layers are formed on p+ -type silicon wafers by electrochemical anodization in hydrofluoric acid solutions. Microechography and acoustic signature, V(z), have been performed at 1.5 GHz and 600 MHz, respectively, in order to study
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::03438928affaba4803a44612ab741222
https://doi.org/10.1007/bf00352128
https://doi.org/10.1007/bf00352128
Publikováno v:
Thin Solid Films. 251:110-115
Two complementary microacoustic methods, microechography and acoustic microscopy, have been used to characterize the cross-linkage in photopolymers. The mechanical properties have been investigated as a function of the exposition time to UV by microe
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::11b29d91a4353af27a6509ae99d93271
https://doi.org/10.1016/0040-6090(94)90674-2
https://doi.org/10.1016/0040-6090(94)90674-2
Autor:
R. Berjoan, José Santiso, Albert Figueras, Rafael Rodríguez-Clemente, C. Combescure, B. Armas, J.M. Saurel, R. Caplain, S. Garelik
Publikováno v:
Materials Science and Engineering: B. 11:83-87
β-SiC layers were obtained by low pressure chemical vapour deposition from tetramethylsilane diluted in H2 without contamination of free silicon and carbon at temperatures between 1100 and 1500 °C and at chamber pressures between 15 and 100 Torr. C
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::41029c05cbf22acd17c60108860b0be3
https://doi.org/10.1016/0921-5107(92)90196-g
https://doi.org/10.1016/0921-5107(92)90196-g
Autor:
J.M. Saurel, A. Foucaran, E. Massonne, Thierry Taliercio, Gilles Despaux, R.J.M. da Fonseca, Pierre Lefebvre
Publikováno v:
Superlattices and Microstructures. 16:21-23
Acoustic microsocopy methods and particularly microechography have made it possible to determine porosity and mechanical properties of porous silicon. Nevertheless, these techniques are limited when porosity becomes important or when the layer thickn
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1de9c36d104410206d4d263f64f0a7bc
https://doi.org/10.1006/spmi.1994.1102
https://doi.org/10.1006/spmi.1994.1102
Akademický článek
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