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Publikováno v:
Microelectronic Engineering. 141:207-210
Purification of carbon-rich Au EBID structures localized post-treatment oxygen + electron beam at room temperature.Display Omitted Purification of carbon-rich Au structures at room temperature.Localized post-treatment: electron beam (e- beam) irradia
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::49a4577a6fc3d10737a9e9295cebc0b4
https://doi.org/10.1016/j.mee.2015.03.034
https://doi.org/10.1016/j.mee.2015.03.034
Autor:
Ana Carmen C. Reis, Leo A.I. Kestens, Roumen Petrov, J.J.L. Mulders, Orlando León García, Yvan Houbaert, Jin-Ho Bae
Publikováno v:
Materials Science Forum. 550:625-630
The microstructural anisotropy together with the crystallographic texture of an industrial grade of X70 pipeline steel is studied by means of the 3D-EBSD technique known also as EBS3 which was recently developed by FEI. Samples of size 8x10x3mm³ wer
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::22b594e0c3d38833742ae58be53ba223
https://doi.org/10.4028/www.scientific.net/msf.550.625
https://doi.org/10.4028/www.scientific.net/msf.550.625
Autor:
A. Gholinia, J.J.L. Mulders
Publikováno v:
Microscopy Today. 14:34-37
Since the early 1990s EBSD (Electron Back Scatter Diffraction) has been developed to become a mature crystallographic analysis technique at the micro and nano-scale. It is applied in a SEM (Scanning Electron Microscope) on samples with a very smooth
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b1a082b2062f4abedf877bd7b626e194
https://doi.org/10.1017/s1551929500057643
https://doi.org/10.1017/s1551929500057643
Autor:
A. P. Day, J.J.L. Mulders
Publikováno v:
Materials Science Forum. :237-244
Three-dimensional (3D) microscopy is a new and rapidly expanding area. A DualBeam system, with both a focused ion beam (FIB) column and an electron column, is a powerful instrument for imaging and sectioning microstructures to generate a full 3D samp
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e395da64a9ab31c2e719f3ab421c119b
https://doi.org/10.4028/www.scientific.net/msf.495-497.237
https://doi.org/10.4028/www.scientific.net/msf.495-497.237
Publikováno v:
Journal of Physics D: Applied Physics. 50:205307
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4b10d6aade9f753b7bd2f924120dd825
https://doi.org/10.1088/1361-6463/aa69e2
https://doi.org/10.1088/1361-6463/aa69e2
Autor:
J.J.L. Mulders
Publikováno v:
Nanofabrication, Vol 1, Iss 1 (2014)
The purity of a structure made with electron beam induced deposition (EBID) is a the major concern when creating micro and nano-scale functionalities, for example for rapid prototyping. Substantial research focuses on the improvements of the purity u
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0ba2b8d89935c73ace463c55f6de303b
https://doi.org/10.2478/nanofab-2014-0007
https://doi.org/10.2478/nanofab-2014-0007
Publikováno v:
Nanotechnology. 24(14)
Electron beam induced deposition (EBID) is a process used for the fabrication of three-dimensional nanostructures of a variety of materials, but direct deposition of pure metallic structures has rarely been achieved. Typically, MeCpPtMe3 as a precurs
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d4081ee9b074deacf1413ad7fc6ab9a2
https://pubmed.ncbi.nlm.nih.gov/23507998
https://pubmed.ncbi.nlm.nih.gov/23507998
Autor:
Aurelien Botman, J.J.L. Mulders
Publikováno v:
Microscopy and Microanalysis, 15 (Suppl. 2), 2009
One technique to create small Pt and Au nano scale direct structures is Electron Beam Induced Deposition (EBID). These structures however, often suffer from included carbon, as the related precursor often is an organo metallic chemical substance. Res
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::aaf067f983a05f24d2b9b0becc72d485
http://resolver.tudelft.nl/uuid:4061b69e-40e0-4b56-8703-895b878ea8a7
http://resolver.tudelft.nl/uuid:4061b69e-40e0-4b56-8703-895b878ea8a7
