Zobrazeno 1 - 10
of 238
pro vyhledávání: '"J.J. Whalen"'
Senescence-like Phenotype After Chronic Exposure to Isoproterenol in Primary Quiescent Immune Cells.
Autor:
Laumann, Michael1 (AUTHOR) michael.laumann@uni-konstanz.de, Palombo, Philipp2 (AUTHOR) philipp.palombo@uni-konstanz.de, Fieres, Judy2 (AUTHOR) judy.salzwedel@web.de, Thomas, Mara2 (AUTHOR) mara.thomas@roche.com, Saretzki, Gabriele3 (AUTHOR) gabriele.saretzki@newcastle.ac.uk, Bürkle, Alexander2 (AUTHOR) alexander.buerkle@uni-konstanz.de, Moreno-Villanueva, Maria2,4 (AUTHOR) maria.moreno-villanueva@uni-konstanz.de
Publikováno v:
Biomolecules (2218-273X). Dec2024, Vol. 14 Issue 12, p1528. 19p.
Autor:
Hu, Yuchen1,2 (AUTHOR) huyuchen9@stu.scu.edu.cn, Peng, Linrui1,2 (AUTHOR) linruipeng@stu.scu.edu.cn, Zhuo, Xinyu1,2 (AUTHOR) zhuoxy@stu.scu.edu.cn, Yang, Chan3 (AUTHOR) yc199207@126.com, Zhang, Yuwei1,2 (AUTHOR) doczhangyw@scu.edu.cn
Publikováno v:
Biomolecules (2218-273X). Dec2024, Vol. 14 Issue 12, p1485. 29p.
Autor:
Gurgoglione, Filippo Luca1,2,3 (AUTHOR), De Gregorio, Mattia1 (AUTHOR), Benatti, Giorgio2 (AUTHOR), Donelli, Davide1 (AUTHOR) davide.donelli@unipr.it, Vignali, Luigi2 (AUTHOR), Solinas, Emilia2 (AUTHOR), Tadonio, Iacopo2 (AUTHOR), Denegri, Andrea2 (AUTHOR), Covani, Marco1 (AUTHOR), Dallaglio, Gabriella1 (AUTHOR), Cortese, Bernardo3,4,5,6 (AUTHOR), Niccoli, Giampaolo1,2 (AUTHOR)
Publikováno v:
Future Pharmacology. Dec2024, Vol. 4 Issue 4, p775-787. 13p.
Autor:
Molnár, Andrea Ágnes1 (AUTHOR) molnar.andrea@semmelweis.hu, Birgés, Kristóf1 (AUTHOR), Surman, Adrienn1 (AUTHOR), Merkely, Béla1 (AUTHOR)
Publikováno v:
International Journal of Molecular Sciences. Dec2024, Vol. 25 Issue 23, p13185. 23p.
Autor:
Mor, Adrian1 (AUTHOR) adrian.mor@outlook.com, Tankiewicz-Kwedlo, Anna1 (AUTHOR) anna.tankiewicz-kwedlo@umb.edu.pl, Ciwun, Marianna1 (AUTHOR) dariusz.pawlak@umb.edu.pl, Lewkowicz, Janina2 (AUTHOR) janka.lewkowicz@gmail.com, Pawlak, Dariusz1 (AUTHOR)
Publikováno v:
Cells (2073-4409). Aug2024, Vol. 13 Issue 15, p1259. 29p.
Autor:
Etienne Sicard, J.J. Whalen, Osami Wada, S. Ben Dhia, Mohamed Ramdani, Todd H. Hubing, M. Coenen, Alexandre Boyer
Publikováno v:
IEEE Transactions on Electromagnetic Compatibility
IEEE Transactions on Electromagnetic Compatibility, Institute of Electrical and Electronics Engineers, 2009, 51 (1), pp.78-100. ⟨10.1109/TEMC.2008.2008907⟩
IEEE Transactions on Electromagnetic Compatibility, 2009, 51 (1), pp.78-100. ⟨10.1109/TEMC.2008.2008907⟩
IEEE Transactions on Electromagnetic Compatibility, Institute of Electrical and Electronics Engineers, 2009, 51 (1), pp.78-100. ⟨10.1109/TEMC.2008.2008907⟩
IEEE Transactions on Electromagnetic Compatibility, 2009, 51 (1), pp.78-100. ⟨10.1109/TEMC.2008.2008907⟩
International audience; Throughout the decades of continuous advances in semiconductor technology, from the discrete devices of the late 1950s to today's billon-transistor system-on-chip, there have always been concerns about the ability of component
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a672bf13955e349067312ffbe473d610
https://hal.archives-ouvertes.fr/hal-02523680
https://hal.archives-ouvertes.fr/hal-02523680
Publikováno v:
MTT-S International Microwave Symposium Digest.
Microwave nsec pulse burnout data have been measured at 9 GHz for three 1 micron gate MESFETs. Values of incident pulse power and absorbed energy required to cause burnout are presented and discussed. Also discussed are the dominant failure modes for
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::746aec03a3091341ed9b995d209172eb
https://doi.org/10.1109/mwsym.1979.1124096
https://doi.org/10.1109/mwsym.1979.1124096
Autor:
J.J. Whalen, R.T. Kemerley
Publikováno v:
MTT-S International Microwave Symposium Digest.
X-Band microsecond pulse, millisecond pulse, and CW burnout data have been measured for GaAs MESFETs. Values of incident pulse power required to cause burn-out are presented and discussed.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7ef41cee15ea388e34c7513e786a57a9
https://doi.org/10.1109/mwsym.1982.1130692
https://doi.org/10.1109/mwsym.1982.1130692
Autor:
H. Ghadamabadi, J.J. Whalen
Publikováno v:
National Symposium on Electromagnetic Compatibility.
A description is given of an investigation to determine statistical variations for radio frequency interference (RFI) demodulation responses in operational amplifier (op amp) circuits. 50% amplitude-modulated (AM) RF signals were injected into the op
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c783234b5c03c126016a8aee1a4642a3
https://doi.org/10.1109/nsemc.1989.37222
https://doi.org/10.1109/nsemc.1989.37222
Autor:
K. Liu, J.J. Whalen
Publikováno v:
IEEE 1988 International Symposium on Electromagnetic Compatibility.
A model for predicting the radiofrequency interference (RFI) susceptibility of CMOS circuits at the design stage, using SPICE, is reported on. The circuit investigated is the RCA CD4007A, which contains three CMOS pairs of n-MOSFETs and p-MOSFETs, in
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d7c2f3db7650025f52a799388fda578c
https://doi.org/10.1109/isemc.1988.14168
https://doi.org/10.1109/isemc.1988.14168