Zobrazeno 1 - 1
of 1
pro vyhledávání: '"J.J. Ravindra Fernando"'
Autor:
Zhiwei Li, Sameer M. Venugopal, Shawn M. O'Rourke, Edward J. Bawolek, S.G. Uppili, R. Shringarpure, H. Shivalingaiah, David R. Allee, Bryan D. Vogt, J.J. Ravindra Fernando, Lawrence T. Clark, Korhan Kaftanoglu
Publikováno v:
IEEE Transactions on Electron Devices.
This paper reviews amorphous silicon thin-film-transistor (TFT) degradation with electrical stress, examining the implications for various types of circuitry. Experimental measurements on active-matrix backplanes, integrated a-Si:H column drivers, an
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::116348022daae581405c54acd008443e
https://doi.org/10.1109/ted.2009.2019387
https://doi.org/10.1109/ted.2009.2019387
