Zobrazeno 1 - 10
of 26
pro vyhledávání: '"J.J. Araiza"'
Publikováno v:
Journal of Alloys and Compounds. 835:155353
Indium tin oxynitride (ITON) thin films were deposited by reactive DC magnetron sputtering technique. The samples were deposited onto glass and silicon (100) substrates at room temperature. For this purpose, the sputtering reactive atmosphere was com
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::95caf44d7c0bf2dabb31fdf78b88a7c9
https://doi.org/10.1016/j.jallcom.2020.155353
https://doi.org/10.1016/j.jallcom.2020.155353
Autor:
M.A. Aguilar-Frutis, J.J. Araiza, J.J. Ortega, Víctor Hugo Méndez-García, G. Alarcón, Ciro Falcony
Publikováno v:
Materials Science and Engineering: B. 187:83-88
The effects of nitrogen incorporation in indium zinc oxide films, as grown by RF reactive magnetron sputtering, on the structural, electrical and optical properties were studied. It was determined that the variation of the N2/Ar ratio, in the reactiv
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::df3ab93ace5bf1a2c3a7c2f0044c38cb
https://doi.org/10.1016/j.mseb.2014.05.005
https://doi.org/10.1016/j.mseb.2014.05.005
Autor:
Ciro Falcony, Z. Rivera-Álvarez, M. A. Aguilar-Frutis, A. N. Meza-Rocha, E. Zaleta-Alejandre, I. M. Sandoval, J.J. Araiza
Publikováno v:
ECS Journal of Solid State Science and Technology. 2:N145-N148
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::650d38b7738d0a7781b40e4d76ba9b4f
https://doi.org/10.1149/2.009307jss
https://doi.org/10.1149/2.009307jss
Publikováno v:
Vacuum. 83:1236-1239
We have studied the influence of the Al incorporation in the crystalline structure of ZrN thin films deposited by dc magnetron sputtering processes at low temperature. The incorporation of the aluminum in the films depends directly on the Ar/N 2 rati
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8261386fb2806a423fd34ac00192c267
https://doi.org/10.1016/j.vacuum.2009.03.012
https://doi.org/10.1016/j.vacuum.2009.03.012
Publikováno v:
Vacuum. 81:1462-1465
ZrN coatings have been grown in an rf sputtering deposition chamber, using different ratios of Ar/N2 (5/1, 5/5, 1/5) in the reactive gas flow. After deposition, the coatings were thermally treated in a 500 °C oxygen atmosphere, in order to test the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c582528bd1323f05f13c4e05f7781b3a
https://doi.org/10.1016/j.vacuum.2007.04.009
https://doi.org/10.1016/j.vacuum.2007.04.009
Publikováno v:
Journal of Materials Science: Materials in Electronics. 16:657-661
The optical, structural and electrical characteristics of aluminum oxynitride thin films deposited on silicon by rf-sputtering under a fixed oxygen flow and two different Ar and N gas flows are reported. The stoichiometry of the films was studied by
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e20c9311a5aa187879b829d0ee9e9c8f
https://doi.org/10.1007/s10854-005-3741-y
https://doi.org/10.1007/s10854-005-3741-y
Autor:
L.A. Hernández-Hernández, E. Campos-González, J. G. Quiñones-Galván, J.J. Araiza, A. Hernández-Hernández, J.S. Arias-Cerón, O. Zelaya-Angel, A. Guillén-Cervantes, F. de Moure-Flores, H. Tototzintle-Huitle
Publikováno v:
Materials Research Express. 1:036404
Polycrystalline visible light photoluminescent zinc oxide (ZnO) thin films have been grown on silicon substrates by the dip immersion sol?gel technique at low sintering temperature. The optical properties of the films were analyzed by UV?vis spectros
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8cb15408ed2dbfdb533b27e8492b06ff
https://doi.org/10.1088/2053-1591/1/3/036404
https://doi.org/10.1088/2053-1591/1/3/036404
Akademický článek
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Akademický článek
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Autor:
M. Lopez, Víctor Hugo Méndez-García, M. Cardenas, Ciro Falcony, G. Contreras-Puente, J.J. Araiza
Publikováno v:
Scopus-Elsevier
Yttrium oxide films deposited by laser ablation on Si(100) substrates have been evaluated for possible application as high dielectric constant insulator layers. The structural, optical and electrical characteristics of these films have been determine
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::bfee437a7ebfbacc137d01d300a19f8a
http://www.scopus.com/inward/record.url?eid=2-s2.0-0032339299&partnerID=MN8TOARS
http://www.scopus.com/inward/record.url?eid=2-s2.0-0032339299&partnerID=MN8TOARS
