Zobrazeno 1 - 10
of 52
pro vyhledávání: '"J.H. Constable"'
Autor:
J.H. Constable
Publikováno v:
IEEE Transactions on Instrumentation and Measurement. 55:2045-2054
Large excess resistance noise has been observed in small conductors surrounded by air. The conductor resistance was found to have a well-defined average power spectral density over the observed frequency range from 10-4 to 200 Hz and the dependence o
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::275165724b96963aca081665bbb317be
https://doi.org/10.1109/tim.2006.884117
https://doi.org/10.1109/tim.2006.884117
Autor:
P. Misri, J.H. Constable
Publikováno v:
IEEE Transactions on Components and Packaging Technologies. 29:809-817
A commercial anisotropic conductive film (ACF) was used to form electrical interconnections between the aluminum metallization on a silicon wafer and tin plated copper pads on a polyimide flexible circuit. Some samples were subjected to temperature/h
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c831b80d323fac7b2faae90c71aef61e
https://doi.org/10.1109/tcapt.2006.885961
https://doi.org/10.1109/tcapt.2006.885961
Autor:
J.H. Constable
Publikováno v:
IEEE Transactions on Components and Packaging Technologies. 29:494-501
The standard model for electrical resistance of an anisotropic conducting film (ACF) bond has been analyzed for the case that includes both constriction resistance and a film resistance between the conducting particle and the bond pad. The electrical
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c6c3f749636a57c7f0a9ca80facb09e2
https://doi.org/10.1109/tcapt.2005.850522
https://doi.org/10.1109/tcapt.2005.850522
Publikováno v:
IEEE Transactions on Device and Materials Reliability. 3:184-190
The observed development of flicker with time in active matrix liquid crystal display (AMLCD) panels has been correlated to the threshold voltage shift of the thin film transistors (TFTs) used in panels. The effect of a threshold voltage shift on the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ed06e03fc1e259c9284f1908fde9d09e
https://doi.org/10.1109/tdmr.2003.817676
https://doi.org/10.1109/tdmr.2003.817676
Autor:
O. Ziv, J.H. Constable
Publikováno v:
IEEE Transactions on Electromagnetic Compatibility. 41:361-365
The channel capacity of a parallel bus structure was examined in relation to the ever increasing demand for signal input and output. The limitations on signal integrity caused by both far-end and near-end crosstalk noise were considered. Expressions
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0716068355a3b69339ef68eb261d57bf
https://doi.org/10.1109/15.809819
https://doi.org/10.1109/15.809819
Autor:
J.H. Constable, C. Lizzul
Publikováno v:
IEEE Transactions on Components, Packaging, and Manufacturing Technology: Part A. 18:142-152
Interconnect electrical resistance is examined as a possible bases for a reliability tool. Measurements are reported of the resistance change of lap shear (60% Sn-40% Pb) solder joints as a function of fatigue. The expected dependence of electrical r
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a3ee0f6ee1db923bf38ca58d26325dbb
https://doi.org/10.1109/95.370748
https://doi.org/10.1109/95.370748
Autor:
C. Sahay, J.H. Constable
Publikováno v:
IEEE Transactions on Components, Hybrids, and Manufacturing Technology. 15:1138-1145
The dependence of the electrical resistance on strain and fatigue was analyzed for the case of electrical interconnections subjected to a sinusoidal strain. Measurements of the resistance change at the drive frequency and at twice the drive frequency
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::19348f2b2c01cc9db7e1c5cfb80a7c0d
https://doi.org/10.1109/33.206940
https://doi.org/10.1109/33.206940
Publikováno v:
Electrical Contacts - 1995. Proceedings of the Forty-First IEEE Holm Conference on Electrical Contacts.
The approach, represented by this work, makes a quantitative study of volume removal as well as of the impact wear mechanism in electrical connectors, taking place under a moderate electrical current. Comparison is made between pure mechanical wear a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cc16310f3a2e0a98cc6130abd789beb7
https://doi.org/10.1109/holm.1995.482898
https://doi.org/10.1109/holm.1995.482898
Publikováno v:
53rd Electronic Components and Technology Conference, 2003. Proceedings..
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e5fa13a5a54140c6f730a634d5cb9ee3
https://doi.org/10.1109/ectc.2003.1216402
https://doi.org/10.1109/ectc.2003.1216402
Autor:
J.H. Constable, D. Zheng
Publikováno v:
1996 Proceedings 46th Electronic Components and Technology Conference.
High resolution electrical resistance measurements were used to monitor interconnection failures on PCMCIA test cards. The cards were clamped at the connector end by a fixture which was attached to a shaker. The shaker was excited at the card's first
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d1a622bb0cc42d59e9bc6749dcc81cc7
https://doi.org/10.1109/ectc.1996.550501
https://doi.org/10.1109/ectc.1996.550501