Zobrazeno 1 - 10
of 82
pro vyhledávání: '"J.E. Barth"'
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 519:205-215
Foil aberration correctors make use of a transparent foil to correct for the spherical and chromatic aberration of electron lenses. The low-voltage foil corrector is a novel type, in which the electrons are retarded to almost 0 eV at the foil. For de
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a65112c191eebcdce0d49934b7126bee
https://doi.org/10.1016/j.nima.2003.11.157
https://doi.org/10.1016/j.nima.2003.11.157
Publikováno v:
IEEE Transactions on Electronics Packaging Manufacturing. 24:99-108
This paper describes a constant impedance transmission line pulse system with new measurement capabilities and improved accuracy. The paper enforces a broader look at transmission line pulse (TLP) data, beyond the I-V curves. Accurate TLP measurement
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6bb7001694d491b7b43c8c2ef9408593
https://doi.org/10.1109/6104.930960
https://doi.org/10.1109/6104.930960
Publikováno v:
Ultramicroscopy, 11, 110, 1411-1419
Delft University of Technology
Delft University of Technology
The low-voltage foil corrector is a novel type of foil aberration corrector that can correct for both the spherical and chromatic aberration simultaneously. In order to give a realistic example of the capabilities of this corrector, a design for a lo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f48638a075de7f911c7a352a450c6cc1
http://resolver.tudelft.nl/uuid:aed4179c-5c8d-4af2-b6f9-9909687ed8a2
http://resolver.tudelft.nl/uuid:aed4179c-5c8d-4af2-b6f9-9909687ed8a2
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 298:263-268
In order to do ray tracing in a charged particle optics system it is necessary to be able to evaluate the fields at an arbitrary point along the path. The finite element method (FEM), using a variable-length quadratic mesh, can yield accurate values
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::dbe3e43b4d8e47c58526659b57132534
https://doi.org/10.1016/0168-9002(90)90625-g
https://doi.org/10.1016/0168-9002(90)90625-g
Publikováno v:
Journal of Applied Physics, 99 (2), 2006
The potential application of carbon nanotubes as electron sources in electron microscopes is analyzed. The resolution and probe current that can be obtained from a carbon nanotube emitter in a low-voltage scanning electron microscope are calculated a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ac50223e07e2e1262f553a70770d287d
http://resolver.tudelft.nl/uuid:b8ae25c8-9e2d-4fa0-bc98-dee31b393eb2
http://resolver.tudelft.nl/uuid:b8ae25c8-9e2d-4fa0-bc98-dee31b393eb2
Autor:
J.E. Barth
Publikováno v:
7th Pulsed Power Conference.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7a26787556dc1e76ae179647c5cfec01
https://doi.org/10.1109/ppc.1989.767638
https://doi.org/10.1109/ppc.1989.767638
Autor:
H.L. Kalter, John K. DeBrosse, J.E. Barth, Hussein I. Hanafi, J.A. Mandelman, J. Gautier, R.H. Dennard
Publikováno v:
1996 IEEE International SOI Conference Proceedings.
Summary form only given. As operating voltages are reduced it becomes increasingly challenging to write a usable signal into the DRAM storage capacitor because of the nonscalability of threshold voltage, due to the limiting effects of subthreshold sl
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::23e241f072e75c2d9d9dd55cf6be1ad3
https://doi.org/10.1109/soi.1996.552531
https://doi.org/10.1109/soi.1996.552531
Publikováno v:
AIP Conference Proceedings.
This paper discusses the design of a remoderation section for the Delft positron microprobe. The positron beam that emerges from the Delft nuclear reactor has a very low brightness. In order to have the maximum current in a microprobe this brightness
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e7e65e1ee2f6b59beb18d649fbc79cc7
https://doi.org/10.1063/1.45530
https://doi.org/10.1063/1.45530
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Akademický článek
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