Zobrazeno 1 - 10
of 106
pro vyhledávání: '"J.C. Rautio"'
Publikováno v:
IEEE Microwave Magazine. 4:87-96
Accurate component modeling is a key factor to successful wireline and wireless circuit design in Si/SiGe BiCMOS and RF CMOS. This article presents the application of two planar electromagnetic simulation methods for reducing the memory and computati
Autor:
J.C. Rautio
Publikováno v:
IEEE Microwave Magazine. 4:35-41
Electromagnetic (EM) analysis has been in regular use in the design of planar high-frequency and microwave circuits for well over a decade. This article provides a brief historical background of this development, a description of recent developments,
Autor:
Veysel Demir, J.C. Rautio
Publikováno v:
IEEE Transactions on Microwave Theory and Techniques. 51:915-921
This paper describes and rigorously validates single- and multiple-layer models of microstrip conductor loss appropriate for high-accuracy application in electromagnetic analysis software. The models are validated by comparison with measurement and b
Publikováno v:
IEEE Transactions on Microwave Theory and Techniques. 48:1361-1368
In this paper, measured results obtained from a narrow-band microstrip filter are compared with computed responses obtained using two different classes of software for various assumed housing conditions. (Some results from filters with wider bandwidt
Autor:
J.C. Rautio
Publikováno v:
IEEE Microwave Magazine. 1:60-67
Microstrip conductor loss exhibits complicated behavior that is not generally recognized. Specifically, there are three frequency ranges of interest. At low frequency, current is uniform through the entire cross-section of the line, and the line beha
Publikováno v:
IEEE Transactions on Microwave Theory and Techniques. 47:115-119
The original paper (see IEEE Microwave Guided Wave Lett., vol. 4, no. 2, p. 87-9, 1998) proposed a means of determining the TEM equivalent Z/sub 0/, which is similar to the technique described by this author. While this author assumes the port discon
Autor:
E.H. Lenzing, J.C. Rautio
Publikováno v:
IEEE Transactions on Microwave Theory and Techniques. 46:162-166
The error due to discretization in a method-of-moments analysis of a parallel plate or metal-insulator-metal (MIM) capacitor is discussed. A technique related to Richardson extrapolation is used to develop a model for the error due to subsectional di
Autor:
J.C. Rautio
Publikováno v:
IEEE Transactions on Microwave Theory and Techniques. 42:2046-2050
A stripline standard is applied to the validation of planar electromagnetic analysis. Since an exact theoretical expression is available for stripline, a benchmark can be specified to the accuracy to which the expressions can be evaluated. Data for t
Autor:
J.C. Rautio
Publikováno v:
2008 IEEE Compound Semiconductor Integrated Circuits Symposium.
Power is inserted into microwave circuits during EM analysis by means of "ports". Such ports always add a small error because of their associated port discontinuity, which takes the form of fringing fields surrounding the port. These errors preclude
Autor:
J.C. Rautio
Publikováno v:
2nd European Conference on Antennas and Propagation (EuCAP 2007).
With appropriate setup, shielded planar EM (electromagnetic) analysis can be used for antenna analysis. While shielded EM analysis can not handle the variety of antenna problems that unshielded analysis can, shielded analysis offers extreme numerical