Zobrazeno 1 - 10
of 55
pro vyhledávání: '"J.C. Pickel"'
Autor:
Robert A. Reed, Ronald D. Schrimpf, Raymond L. Ladbury, Paul W. Marshall, Elizabeth Polidan, J.C. Pickel, Augustyn Waczynski, Robert A. Weller, Robert E. McMurray, M. McKelvey, Marcus H. Mendenhall, Scott D. Johnson, T.M. Jordan, Kim Ennico, C. McCreight, B. Fodness, G. Gee
Publikováno v:
IEEE Transactions on Nuclear Science. 52:2657-2663
We present measurements of proton-induced single event transients in ultra-low noise HgCdTe IR detector arrays being developed for space-based astronomy and compare to modeling results.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5f5a90105fef948ae4a529960957feb7
https://doi.org/10.1109/tns.2005.860732
https://doi.org/10.1109/tns.2005.860732
Autor:
Robert A. Reed, G. Gee, J.C. Pickel, B. Fodness, Robert E. McMurray, M. McKelvey, Roy R. Johnson, Paul W. Marshall, T.M. Jordan, C. McCreight, K.A. Ennico
Publikováno v:
IEEE Transactions on Nuclear Science. 50:1954-1959
We present measurements of the proton-induced secondary particle environment in the vicinity of an infrared focal plane array. Measurements were made of the energy depositions from secondary electrons and scattered protons from the interior of a cryo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::02bc40803d3b015a862bcbb83a7140ff
https://doi.org/10.1109/tns.2003.821603
https://doi.org/10.1109/tns.2003.821603
Publikováno v:
IEEE Transactions on Nuclear Science. 50:2219-2224
Results are presented on technique using displacement damage from energetic ions to suppress single event latchup in commercial off-the-shelf (COTS) CMOS integrated circuits. Ions implanted through the back of a thinned chip degrade the parasitic bip
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::532bede1bf89802e1d2e605577482b53
https://doi.org/10.1109/tns.2003.821607
https://doi.org/10.1109/tns.2003.821607
Autor:
John E. Hubbs, Douglas C. Arrington, J.C. Pickel, Paul W. Marshall, R.A. Ramos, Cheryl J. Marshall, G. Gee, Robert A. Reed
Publikováno v:
IEEE Transactions on Nuclear Science. 50:1968-1973
We compare measurements and modeling of 27 and 63 MeV proton-induced transients in a large-format HgCdTe long wavelength infrared (LWIR) focal plane assembly operating at 40 K. Charge collection measurements describe very limited diffusion of carrier
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::01f88d3ae7ae4736dfee8b108762af35
https://doi.org/10.1109/tns.2003.820749
https://doi.org/10.1109/tns.2003.820749
Autor:
Robert A. Reed, J.C. Pickel, Guofu Niu, Ken LaBel, K. Fritz, M.A. Carts, B. Fodness, G. Vizkelethy, Paul E. Dodd, R. Krithivasan, Paul W. Marshall, T.L. Irwin, P.A. Riggs, John D. Cressler, Barry K. Gilbert, J.F. Prairie, B.A. Randall
Publikováno v:
IEEE Transactions on Nuclear Science. 50:2184-2190
Combining broad-beam circuit level single-event upset (SEU) response with heavy ion microprobe charge collection measurements on single silicon-germanium heterojunction bipolar transistors improves understanding of the charge collection mechanisms re
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2bafa8bf38f5ac9b0b381edac1f01fe7
https://doi.org/10.1109/tns.2003.821815
https://doi.org/10.1109/tns.2003.821815
Publikováno v:
IEEE Transactions on Nuclear Science. 50:671-688
Photonic imagers are being increasingly used in space systems, where they are exposed to the space radiation environment. Unique properties of these devices require special considerations for radiation effects. This paper summarizes the evolution of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f3987a94b19a2f6b1f0154058e5838d6
https://doi.org/10.1109/tns.2003.813126
https://doi.org/10.1109/tns.2003.813126
Autor:
Robert A. Reed, Donald F. Figer, Paul W. Marshall, G. Gee, Raymond L. Ladbury, Louis E. Bergeron, T.M. Jordan, B. Fodness, S.D. Kniffin, J.C. Pickel, Bernard J. Rauscher
Publikováno v:
IEEE Transactions on Nuclear Science. 49:2765-2770
Dark frames from orbiting infrared detector arrays are analyzed using a charge-collection model to investigate the effects of secondary and primary particle environments in infrared detectors and related electronics. The effects of different componen
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::131035d1befb8b657c11a31525e66640
https://doi.org/10.1109/tns.2002.805384
https://doi.org/10.1109/tns.2002.805384
Autor:
Bernard J. Rauscher, T.M. Jordan, J.C. Pickel, G. Gee, Raymond L. Ladbury, Robert A. Reed, Paul W. Marshall, B. Fodness
Publikováno v:
IEEE Transactions on Nuclear Science. 49:2822-2829
A modeling approach is described for predicting charge collection in space-based infrared detector arrays due to ionizing particle radiation. The modeling uses a combination of analytical and Monte Carlo techniques to capture the essential features o
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::64176f5a24c285daeb3fd51090078923
https://doi.org/10.1109/tns.2002.805382
https://doi.org/10.1109/tns.2002.805382
Publikováno v:
IEEE Transactions on Nuclear Science. 48:2136-2139
We identify a discrepancy between experimental data and model predictions by a widely used radiation transport code, SRIM. We describe a method for determining the implant and damage profiles of energetic heavy ions that better agrees with experiment
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::903a78df78d5361b2eedf0cfe8591852
https://doi.org/10.1109/23.983185
https://doi.org/10.1109/23.983185
Publikováno v:
IEEE Transactions on Nuclear Science. 48:1865-1871
The effects of substrate and epitaxial-layer thickness on the single-event upset and single-event latchup response of integrated circuits are studied using experiments and three-dimensional device simulations. Reducing substrate thickness can be an e
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::03067ce79bc20e28f9997e1b4ead7c82
https://doi.org/10.1109/23.983144
https://doi.org/10.1109/23.983144