Zobrazeno 1 - 10
of 102
pro vyhledávání: '"J.C. Daly"'
Akademický článek
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.
Publikováno v:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 5:401-407
This paper describes the design of an archival temperature monitoring tag to be used to collect habitat information of Atlantic salmon during the marine phase of the species' natural history. The monolithic circuit should not exceed an average power
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e4cc61579cd3aa4d97714874bef6f4b2
https://doi.org/10.1109/92.645066
https://doi.org/10.1109/92.645066
Publikováno v:
IEEE Journal of Solid-State Circuits. 29:580-584
When a comprehensive fault model is considered, static CMOS VLSI has long been prohibited from realizing concurrent error detecting (CED) circuits due to the unique analog faults (bridging and stuck-on faults). In this paper, we present the design, f
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d0ee55323128ee31938b47a568ae5c03
https://doi.org/10.1109/4.284710
https://doi.org/10.1109/4.284710
Publikováno v:
IEEE Journal of Solid-State Circuits. 28:72-77
Built-in current testing is known to enhance the defect coverage in CMOS VLSI. An experimental CMOS chip containing a high-speed built-in current sensing (BICS) circuit design is described. This chip has been fabricated through MOSIS 2- mu m p-well C
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5f4355c798f8be749c2fbdd6613103c3
https://doi.org/10.1109/4.179205
https://doi.org/10.1109/4.179205
Publikováno v:
Journal of plastic, reconstructiveaesthetic surgery : JPRAS. 64(4)
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b5650c6584b71c5b36938b2314e60dbc
https://pubmed.ncbi.nlm.nih.gov/21277268
https://pubmed.ncbi.nlm.nih.gov/21277268
Publikováno v:
Proceedings of the IEEE 31st Annual Northeast Bioengineering Conference, 2005..
In this paper we present the design and testing of a 32-channel full-customized CMOS biopotential sensor integrated circuit for sensing the propagation of action potentials in single nerve cell. The chip provides a satisfactory signal-to-noise ratio
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4a0f3277488e6f4d91bbad7cfe7e2f5c
https://doi.org/10.1109/nebc.2005.1432001
https://doi.org/10.1109/nebc.2005.1432001
Publikováno v:
Proceedings., Eighth University/Government/Industry Microelectronics Symposium.
The authors describe a structured VLSI implementation of a high-speed ring-based switch. The system achieves high throughput, is fully nonblocking, and is simpler and more flexible than traditional switching techniques. All information transfers are
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b6758a4e773b4b8c7900a4bec1ae906e
https://doi.org/10.1109/ugim.1989.37347
https://doi.org/10.1109/ugim.1989.37347
Publikováno v:
Proceedings., Eighth University/Government/Industry Microelectronics Symposium.
A course is described that provides electrical engineering students at the University of Rhode Island with experience in modern bipolar integrated circuit design. Student designs are fabricated by Cherry Semiconductor Corporation (CSC). Semicustom ch
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f34981548aa233cdb4378bf06a15685d
https://doi.org/10.1109/ugim.1989.37298
https://doi.org/10.1109/ugim.1989.37298
Publikováno v:
[1992] Proceedings of the 35th Midwest Symposium on Circuits and Systems.
The architecture and operation of a self-routing crossbar switch with multiple channels per input and output port are described. The crossbar is the building block for an asynchronous transfer mode switch fabric using delta networks with multiple lin
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::613443025a7af9d73b2b0835139237e8
https://doi.org/10.1109/mwscas.1992.271190
https://doi.org/10.1109/mwscas.1992.271190
Publikováno v:
VTS
CMOS is a popular technology today for very large scale integrated (VLSI) circuits. But, conventional functional testing cannot guarantee the detection of some defects. Built-in current testing has been suggested to enhance the defect coverage. In th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3ae9b70a8e727e5a03a9a2edaa0defe8
https://doi.org/10.1109/vtest.1992.232771
https://doi.org/10.1109/vtest.1992.232771