Zobrazeno 1 - 10
of 336
pro vyhledávání: '"J.A. Woollam"'
Autor:
J.A. Woollam, C.W. Chu
High pressure science is a rapidly growing diverse fi. e1d. The high pressure technique has become a powerful tool for both the study and preparation of materials. In spi. te of the many high pressure conferences held in recent years, I felt that the
Publikováno v:
7th Joint MMM-Intermag Conference. Abstracts (Cat. No.98CH36275).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3c5b1d17b7f811b1a9b110c2b92ae2f9
https://doi.org/10.1109/intmag.1998.737369
https://doi.org/10.1109/intmag.1998.737369
Autor:
Y.B. Zhang, J.A. Woollam
Publikováno v:
IEEE Transactions on Magnetics. 31:3262-3264
Several series of sputtered Co(0.2 nm)/Ni (0.8 nm) multilayered films have been annealed up to 425/spl deg/C in air. The annealed samples maintain a perpendicular easy direction and have large magnetic coercivity values. For one annealing condition,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c56dee35091ba06e873382b3699a6c49
https://doi.org/10.1109/20.490343
https://doi.org/10.1109/20.490343
Publikováno v:
IEEE Transactions on Magnetics. 30:4437-4439
Spectroscopic (300-800 nm) magneto-optic measurements (polar Kerr rotation and ellipticity), as well as spectroscopic (250-1000 nm) ellipsometric measurements have been taken on a series of CoNi and TbCo multilayer nanostructures. The magnetic layers
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a1f06cdaefb4a2309909276e2671d294
https://doi.org/10.1109/20.334112
https://doi.org/10.1109/20.334112
Publikováno v:
Proceedings of 1994 IEEE 6th International Conference on Indium Phosphide and Related Materials (IPRM).
Optical constants appropriate for ellipsometric thickness measurements have been determined for strained AlAs and InAs layers on an InP substrate with lattice matched InGaAs buffer layers. A procedure involving the simultaneous analysis of data from
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fb7d317106483a0ea6f2c475ac95cf5d
https://doi.org/10.1109/iciprm.1994.328177
https://doi.org/10.1109/iciprm.1994.328177
Publikováno v:
IEEE Transactions on Magnetics. 26:1346-1348
A procedure involving normal-angle-of-incidence Kerr spectroscopy, variable-angle-of-incidence spectroscopic ellipsometry, and variable-angle-of-incidence spectroscopic magnetooptic ellipsometry has been developed. It makes it possible to extract lay
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::af62986428b28d612d4d4f41ff482193
https://doi.org/10.1109/20.104370
https://doi.org/10.1109/20.104370
Publikováno v:
MRS Proceedings. 242
Spectroscopie ellipsometry is a well developed technique for studying the semiconductor materials and heterostructures. Here, we have applied this technique to in-situ studies of ZnSe and ZnCdSe growth in a low pressure organometallic vapor phase epi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f0c24b0740fe31b4fd7694ea06434329
https://doi.org/10.1557/proc-242-237
https://doi.org/10.1557/proc-242-237