Zobrazeno 1 - 10
of 115
pro vyhledávání: '"J.A. Roger"'
Publikováno v:
Journal of Luminescence. 121:507-516
Tin oxide (SnO 2 )-layers-doped terbium and europium ions are elaborated by the sol-gel method on silicon substrates. After annealing at 500 °C, the transmission electron microscopy revealed a crystallization of tin oxide. The emission properties of
Publikováno v:
physica status solidi (a). 202:1508-1512
Tin dioxide doped with antimony (SnO 2 :Sb) and sol-gel doped with terbium (Tb 3+ ) were deposited on porous silicon (PS) layers and on monocrystalline Si wafers. Energy dispersive X-ray (EDX) analysis and Auger electron spectroscopy (AES) show the p
Publikováno v:
physica status solidi (c). 2:3349-3353
The incorporation of antimony doped tin oxide (SnO2:Sb), prepared from the sol gel method, into luminescent porous silicon (PS) layers is investigated. Characterisation of the resulting structures by photoluminescence (PL) is presented. It shows that
Publikováno v:
Materials Science and Engineering: B. 105:157-160
Europium or terbium and europium have been incorporated into luminescent porous silicon (Eu3+/PS and (Eu3++Tb3+)/PS) by simple impregnation of PS layers with chloride solution of rare earth. This impregnation has been followed by Rutherford back-scat
Publikováno v:
Materials Science and Engineering: B. 105:8-11
Terbium (Tb 3+ ) and europium (Eu 3+ )-doped tin oxide (SnO 2 ) was prepared using the sol–gel method in order to form SnO 2 :Tb 3+ and SnO 2 :Eu 3+ nanocomposites on monocrystalline Si wafers and porous Si (PS) substrates. The energy dispersive X-
Publikováno v:
Thin Solid Films. 445:20-25
Indium Tin Oxide (ITO) thin films have been deposited by the Sol–Gel Dip-Coating technique, the starting solutions being prepared from chlorides. These multilayered films were crystallized by means of a classical heat treatment at temperatures rang
Autor:
Brahim Bessais, Valentin S. Teodorescu, A. Moadhen, Corneliu Ghica, Kais Daoudi, Meherzi Oueslati, M.G. Blanchin, J.A. Roger, Bruno Canut, C.S Sandu
Publikováno v:
Materials Science and Engineering: B. 101:262-265
Porous silicon (PS)-based structures were formed by deposition of an indium tin oxide (ITO) onto PS surface using the sol–gel spin coating route. Two types of thermal annealing processes, classical and rapid thermal annealing, were used in order to
Publikováno v:
Semiconductor Science and Technology. 18:703-707
SnO2:Sb sol–gel derived thin films doped with Tb3+ were deposited on porous silicon (PS) layers. Transmission electron microscopy observations, electron diffraction patterns and energy dispersive x-ray analysis revealed the crystallization of small
Publikováno v:
physica status solidi (a). 197:350-354
Tin oxide doped with europium (SnO 2 : Eu 3+ ) or doped with europium and terbium (SnO 2 : (Eu 3+ + Tb 3+ )), prepared from the sol-gel technique, is incorporated into luminescent porous silicon (PS) layers. Rutherford Backscattering (RBS) measuremen
Autor:
M. Ferid, Meherzi Oueslati, Bruno Canut, Kais Daoudi, J.A. Roger, H. Elhouichet, A. Moadhen, C.S Sandu
Publikováno v:
physica status solidi (a). 197:360-364
Porous silicon (PS) doped with terbium (Tb 3+ ) has been prepared by impregnation of PS layers with chloride solution of terbium. The dependency of photoluminescence (PL) intensity on the Tb 3+ concentration has been studied. Rutherford Back-scatteri