Zobrazeno 1 - 10
of 58
pro vyhledávání: '"J.-P. Schlomka"'
Publikováno v:
Europhysics Letters (EPL). 52:330-336
We show that the density of liquids is altered significantly next to a hard wall. Thin films of van der Waals liquids on silicon substrates have been prepared and investigated by means of X-ray reflectivity. This probe yields density profiles on an a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::806fc115734a7170a878eaaa520b6547
https://doi.org/10.1209/epl/i2000-00443-7
https://doi.org/10.1209/epl/i2000-00443-7
Autor:
S. Mantl, O. H. Seeck, C. Dieker, Werner Press, J.-P. Schlomka, J. Stettner, L. Kappius, Metin Tolan, I. D. Kaendler
Publikováno v:
Journal of applied physics 87, 133 (2000).
A series of buried CoSi2 layers prepared by a modified molecular beam epitaxy process (allotaxy) and a subsequent wet-oxidation process was investigated by x-ray scattering. The oxidation time which determines the depth in which the CoSi2 layers are
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5ecfcccf79102fd4ba9ab1be2e2f6822
https://doi.org/10.1063/1.371834
https://doi.org/10.1063/1.371834
Autor:
Rainer Adelung, Werner Press, R. Schwedhelm, J.-P. Schlomka, Lutz Kipp, S. Woedtke, Metin Tolan, Michael Skibowski
Publikováno v:
Physical Review B. 59:13394-13400
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4b05847d294eb752e36955385b465553
https://doi.org/10.1103/physrevb.59.13394
https://doi.org/10.1103/physrevb.59.13394
Publikováno v:
Physical Review B. 59:3474-3479
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f763ce2ff99c6b2248fcfe0a9510cb6c
https://doi.org/10.1103/physrevb.59.3474
https://doi.org/10.1103/physrevb.59.3474
Autor:
Jonathan Sokolov, O. H. Seeck, S. K. Sinha, J.-P. Schlomka, Miriam Rafailovich, Z. Li, Metin Tolan, Werner Press, J. Wang
Publikováno v:
Physical review letters 81(13), 2731-2734 (1998). doi:10.1103/PhysRevLett.81.2731
Physical review letters 81(13), 2731 - 2734 (1998). doi:10.1103/PhysRevLett.81.2731
Surfaces of thin dewetted polyethylene-propylene films were investigated by atomic force microscopy (AFM) and x-ray scattering. The AFM images show the mesoscopi
Surfaces of thin dewetted polyethylene-propylene films were investigated by atomic force microscopy (AFM) and x-ray scattering. The AFM images show the mesoscopi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7981b40db9d10fe64c2340bf0b9911b7
https://doi.org/10.1103/physrevlett.81.2731
https://doi.org/10.1103/physrevlett.81.2731
Publikováno v:
Physica B: Condensed Matter. 248:140-145
In this work the structural and magnetic properties of NiMnSb (NMS)-films deposited at different temperatures were investigated to determine optimal sample preparation conditions. Films of NMS were sputtered from a composite target onto heated (150
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bc2cafe8d93a48fcf6678409bef57a19
https://doi.org/10.1016/s0921-4526(98)00221-x
https://doi.org/10.1016/s0921-4526(98)00221-x
Publikováno v:
Journal of Applied Crystallography. 30:963-967
Within the Born approximation, a cumulant expansion is used for the formulation of X-ray or neutron reflectivity. Odd- (third-) order cumulants indicate asymmetric profiles; they may only be detected in layer systems via a Qz dependence of the oscill
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7a0f599c2731cb1e8d2a4c37352f6b90
https://doi.org/10.1107/s002188989700441x
https://doi.org/10.1107/s002188989700441x
Publikováno v:
Physical Review B. 56:4085-4091
Amorphous silicon films with thicknesses ranging from about 20 \AA{} to 2000 \AA{} were evaporated onto silicon substrates. The surface and interfaces were then investigated by specular and diffuse x-ray scattering experiments in the region of total
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::74108bb7aefe0c05561ddfbff34313f3
https://doi.org/10.1103/physrevb.56.4085
https://doi.org/10.1103/physrevb.56.4085
Autor:
Metin Tolan, E. Sackmann, V. Nitz, J. Stettner, J.-P. Schlomka, Werner Press, M. Stelzle, O. H. Seeck
Publikováno v:
Physical Review B. 54:5038-5050
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ae5131408e7afcbeea3b110ce4d86d09
https://doi.org/10.1103/physrevb.54.5038
https://doi.org/10.1103/physrevb.54.5038
Autor:
Roger Pynn, J.-P. Schlomka, O. H. Seeck, Metin Tolan, Michael R. Fitzsimmons, J. Stettner, Werner Press
Publikováno v:
Physica B: Condensed Matter. 221:44-52
Four samples with different numbers of Si/Ge-bilayers were grown at the same time by high vacuum vapor deposition onto Si(111)-substrates at room temperature. Diffuse scattering experiments within the region of total external reflection were carried
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1244ed3a41132e50cab2398a339e8b76
https://doi.org/10.1016/0921-4526(95)00903-5
https://doi.org/10.1016/0921-4526(95)00903-5