Výsledky vyhledávání - "J.-P. Chevalier"

Cleaning and nitridation of (100) GaAs surfaces: a high resolution electron microscopy study

Autor: N Bonnet, J. P. Chevalier, P. Friedel, Pierre Ruterana

Native oxides play a crucial role in the parasitic electrical effects of GaAs surface and for passivation to be effective these have to be eliminated. Si3N4 can then be deposited as an encapsulating layer. We report high resolution cross-sectional el

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::e98fb863321c002803087bae401700d1
https://doi.org/10.1201/9781003069621-5

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Bulk and surface defects in implanted and annealed GaAs

Autor: J. Maluenda, P. Deconinck, Georges Martin, J. P. Chevalier, Pascal Bellon

Publikováno v: Microscopy of Semiconducting Materials, 1987

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::37e2a44aec06446d1075ffc3cb195e09
https://doi.org/10.1201/9781003069621-50

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Akademický článek

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Tribological behavior of hafnium diboride thin films

Autor: Navneet Kumar, J. E. Gerbi, John R. Abelson, Andreas A. Polycarpou, Sreenivas Jayaraman, J. P. Chevalier, Abhishek Chatterjee, Pascal Bellon

Publikováno v: Surface and Coatings Technology. 201:4317-4322

Transition metal diborides and their coatings offer an excellent combination of high hardness, high chemical stability and high thermal conductivity, thus they are excellent candidates for a wide range of tribological applications. In this work, stoi

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::64c5e5f6efc62069bface9b182a9b52d
https://doi.org/10.1016/j.surfcoat.2006.08.086

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HfB2 and Hf–B–N hard coatings by chemical vapor deposition

Autor: John R. Abelson, Sreenivas Jayaraman, J. E. Gerbi, Gregory S. Girolami, Do Young Kim, Pascal Bellon, Yu Yang, J. P. Chevalier, Abhishek Chatterjee

Publikováno v: Surface and Coatings Technology. 200:6629-6633

Hard, dense and conformal hafnium diboride (HfB2) thin films were obtained by CVD from the precursor Hf[BH4]4 at deposition temperatures ≤350 °C. As-deposited films were X-ray amorphous but transformed to a nanocrystalline structure after being an

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::995e948ec4c060a62b1d875f039a779d
https://doi.org/10.1016/j.surfcoat.2005.11.040

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Electron microscopy nanoscale characterization of ball-milled Cu–Ag powders. Part I: Solid solution synthesized by cryo-milling

Autor: S. Zghal, Fang Wu, Pascal Bellon, Martin Hÿtch, Ray D. Twesten, J. P. Chevalier

Publikováno v: Acta Materialia. 50:4695-4709

We present a study of nanostructured Cu–Ag material obtained by low temperature ball milling. The microstructural characterization is carried out using a wide variety of transmission electron microscopy (TEM) techniques from conventional dark-field

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::46614593b7666f3b88dec97ed4941235
https://doi.org/10.1016/s1359-6454(02)00285-9

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Measurement of roughness and diffuseness of interfaces

Autor: Michael Walls, Martin Hÿtch, J.-P. Chevalier

Publikováno v: Ultramicroscopy. 83:217-225

We propose a simple formalism which allows the separation of the contributions, due to roughness and chemical interdiffusion, to the total width of an interface by using two-dimensional information from either images or chemical maps. A definition is

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e5648cd4221fea9acff7f0b2c277b93c
https://doi.org/10.1016/s0304-3991(00)00016-4

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