Výsledky vyhledávání - "J.-M. Daveau"

Design and performance parameters of an ultra-low voltage, single supply 32bit processor implemented in 28nm FDSOI technology

Autor: Philippe Roche, Cyril Bottoni, Lorenzo Ciampolini, David Meyer, Patrick Girard, Arnaud Virazel, F. Giner, Sylvain Clerc, Alberto Bosio, Fady Abouzeid, Darayus Adil Patel, S. Naudet, Robin Wilson, J. M. Daveau

Publikováno v: Quality Electronic Design (ISQED), 2015 16th International Symposium on
ISQED: International Symposium on Quality Electronic Design
ISQED: International Symposium on Quality Electronic Design, Apr 2015, Santa Clara, United States. pp.366-370, ⟨10.1109/ISQED.2015.7085453⟩
ISQED

International audience; This work presents a single-supply SPARC 32b V8 microprocessor designed with Ultra Low Voltage (ULV) adapted standard cells and memories, aiming at low energy operation and stand by power. The microprocessor, equipped with 10

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::435fb7d9452d4f4789fb78996d14909c
https://hal-lirmm.ccsd.cnrs.fr/lirmm-01272913

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Frequency and Voltage Effects on SER on a 65nm Sparc-V8 Microprocessor Under Radiation Test

Autor: Gilles Gasiot, Cyril Bottoni, Philippe Roche, Fady Abouzeid, Lirida Alves de Barros Naviner, Benjamin Coeffic, Sylvain Clerc, J. M. Daveau

Publikováno v: Proceedings of IEEE International Reliability Physics Symposium (IRPS)
Proceedings of IEEE International Reliability Physics Symposium (IRPS), Apr 2015, Monterrey, CA, United States
HAL
IRPS

We present both heavy ion and alpha test results for SPARCV8 pipelined-microprocessors fabricated in a space CMOS 65nm platform. Two design implementations, standard and radiation-hardened, are compared at 50/300MHz and 0.8V/1.2V. The dominant failur

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e50d80a7cd048a55fa629493c41add36
https://hal.telecom-paris.fr/hal-02287890

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Akademický článek

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Heavy ions test result on a 65nm Sparc-V8 radiation-hard microprocessor

Autor: Fady Abouzeid, J. M. Daveau, Lirida Alves de Barros Naviner, Cyril Bottoni, Gilles Gasiot, Sylvain Clerc, Maximilien Glorieux, Philippe Roche

Publikováno v: 2014 IEEE International Reliability Physics Symposium.

In this paper, we present the heavy-ion radiation test results for a 7-stage SPARC micro-processor. Special software handlers enabled fine grained classification of the types of crashes. The measured crash cross sections are compared with those predi

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::3fc6d18ad31824f8b2b46378731de758
https://doi.org/10.1109/irps.2014.6861096

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Automating the design of SOCs using cores

Autor: F. White, R. Wagner, J.-M. Daveau, M. Muhlada, C. Fellenz, W.R. Lee, Reinaldo A. Bergamaschi, Subhrajit Bhattacharya

Publikováno v: IEEE Design & Test of Computers. 18:32-45

Assembling a system on a chip using IP blocks is an error-prone, labor-intensive, and time-consuming process. Emerging high-level tools can help by automating many of the design tasks.

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::18d3fee37e27e742a8d8c7e433d4d660
https://doi.org/10.1109/54.953270

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Hardware/Software Co-Design Methodology for Design of Embedded Systems

Autor: Ahmed Amine Jerraya, M. Romdhani, J. M. Daveau, G. F. Marchioro, Carlos Valderrama, T. Ben Ismail, M. Abid, A. Changuel

Publikováno v: Integrated Computer-Aided Engineering. 5:69-84

This paper presents the main co-design concepts of distributed embedded hardware/software systems through a detailed presentation of a methodology and an environment for codesign. This presentation gives a comprehensive description of different codes

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::a387b5676369d02ce02577cce3320074
https://doi.org/10.3233/ica-1998-5106

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Space radiation and reliability qualifications on 65nm CMOS 600MHz microprocessors

Autor: Sylvain Clerc, Vincent Huard, J.L. Autran, Cyril Bottoni, Gilles Gasiot, Maximilien Glorieux, L. Hili, L. Dugoujon, Florence Malou, J. M. Daveau, F. Cacho, Philippe Roche, R. Weigand, Fady Abouzeid

Publikováno v: 2013 IEEE International Reliability Physics Symposium (IRPS).

Recent space programs have reached the limits of the current space digital ASIC offers, mainly relying on CMOS 180nm. The new ST CMOS 65nm space program described in this paper shows how those limits are overcome. Small modifications to the commercia

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::e9bbd46cba5414accceb82869c813bbe
https://doi.org/10.1109/irps.2013.6532051

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Growing Interest of Advanced Commercial CMOS Technologies for Space and Medical Applications. Illustration with a New Nano-Power and Radiation-Hardened SRAM in 130nm CMOS

Autor: P. Dautriche, Mark A. Lysinger, Philippe Roche, Gilles Gasiot, Mehdi Zamanian, J. M. Daveau

Publikováno v: IOLTS

This paper reviews recent experimental confirmations that the intrinsic radiation robustness of commercial CMOS technologies naturally improves with the down-scaling. When additionally using innovative design techniques, it becomes now possible to as

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::157ea192293a9fdbea91652adce96f06
https://doi.org/10.1109/iolts.2008.60

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Hardware/Software Co-design

Autor: G. F. Marchioro, Ph. Le Marrec, Lovic Gauthier, J. M. Daveau, A. Baghdadi, Fabiano Hessel, Ahmed Amine Jerraya, Nacer-Eddine Zergainoh, P. Coste, M. Romdhani, T. Ben Ismail, Carlos Valderrama

Publikováno v: Design of Systems on a Chip : Design and Test
Design of Systems on a Chip : Design and Test, Springer, pp.133-158, 2007, 978-0-387-32499-9. ⟨10.1007/0-387-32500-X_7⟩
Design of Systems on a Chip: Design and Test ISBN: 9780387324999

International audience; Co-design is an important step during rapid system prototyping. Starting from a system-level specification, Co-design produces a heterogeneous architecture composed of software, hardware, and communication modules. This paper

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b233a5b910615f8779857a2ac20b317b
https://hal.archives-ouvertes.fr/hal-02124753

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