Zobrazeno 1 - 4
of 4
pro vyhledávání: '"J.-J. Guena"'
Autor:
M.H. Gibson, Robert E. Horn, Anand Gopinath, P.J. Meier, S.G. Pintzos, D.J. Coleman, Harold Jacobs, J.P. Bolloch, J.A. Paul, S.D. Shamasundara, S. Shindo, C.D. Gupta, Z. Paunovic, Tatsuo Itoh, E. Freibergs, M.-T. Cotte, S. Pavlin, A. Presser, W.R. Wisseman, Y. Konishi, Jr. Yu-Wen Chang, C. Thebault, S. Kamihashi, I. Thomson, Hua Quen Tserng, T. Takada, B.M. Neale, K.L. Klohn, R. Schnitzler, D.W. Shaw, Reinhold Pregla, J.-J. Guena, J.-P. Ramy, T.E. Rozzi, Martin Victor Schneider, T. Itanami, Y. Tajima, T.F. McMaster, F.H. Doerbeck, K. Solbach, R.H. Knerr, Darko Kajfez, M. Hirayama, A.S. Hebert, K.C. Gupta, E.R. Carlson
Publikováno v:
IEEE Transactions on Microwave Theory and Techniques. 26:836-842
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6e45c42239d5f64d83699f7389ef08f8
https://doi.org/10.1109/tmtt.1978.1129496
https://doi.org/10.1109/tmtt.1978.1129496
Publikováno v:
IEEE Transactions on Microwave Theory and Techniques. 26:814-820
Two technologies can be used in the fabrication of microwave integrated circuits (MIC's), thick film and thin film. This paper describes and compares these technologies. Two types of substrates commonly used in MIC's are tested, alumina (AL/sub 2/O/s
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2e668eddc8b64e417be53d927ab74c5b
https://doi.org/10.1109/tmtt.1978.1129492
https://doi.org/10.1109/tmtt.1978.1129492
Publikováno v:
Microelectronics International. 2:57-59
Because of its lower dielectric constant and loss tangent, and its greater surface smoothness, fused silica is very suitable for use in the KU band and above, but its cost is very high. The purpose of this paper is therefore to select a new substrate
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::238b8de869e5e432e19c3d541d903f34
https://doi.org/10.1108/eb044160
https://doi.org/10.1108/eb044160
Akademický článek
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.