Zobrazeno 1 - 10
of 52
pro vyhledávání: '"J. W. Garland"'
Autor:
Ashok Kumar, W. C. Orosz, J. W. Garland, Dinakar Ramadurai, Andrew J. Nelson, Larry D. Stephenson
Publikováno v:
Particulate Science and Technology. 29:252-259
A fast-triggered photolytic technology based on the on-demand release of biocides encapsulated within phospholipid nanoparticles has been developed for the neutralization of biological contaminants such as bacteria. Fast-triggered release occurs when
Publikováno v:
Journal of Electronic Materials. 30:637-642
Spectroscopic ellipsometry (SE) has proven to be a very reliable technique for the in-situ monitoring of the substrate temperature and alloy composition during the HgCdTe epitaxy. In this work, the influence of the variations in the angle of incidenc
Publikováno v:
Journal of Electronic Materials. 29:742-747
In this work in-situ spectroscopic ellipsometry (SE) has been applied for the simultaneous determination of the growth temperature and alloy composition for the epitaxial Cd1−xZnxTe(211)/Si(211) structure. The optical dielectric functions of CdTe a
Publikováno v:
Physical Review B. 56:4786-4797
Publikováno v:
Semiconductor Science and Technology. 11:521-524
A form of contactless electroreflectance, vacuum electroreflectance (VER), is used to quantitatively compare photoreflectance (PR) with electroreflectance (ER). It is found that the amplitude of the VER signal for a given applied modulation taken und
Publikováno v:
Thin Solid Films. 233:148-152
The usual procedure for obtaining critical-point energies and linewidths from spectroscopic ellipsometry (SE) data is numerically to smooth and differentiate those data and then to fit them to parametrized theoretical functional forms. That procedure
Publikováno v:
Physical Review B. 47:1876-1888
In a previous paper, the authors proposed a model for the optical dielectric function of zinc-blende semiconductors. It was found to be more generally valid than previous models. In this paper, it is used to obtain an analytic expression for the diel
Publikováno v:
Review of Scientific Instruments. 63:2958-2966
Spectroscopic ellipsometry using photoelastic modulator [phase modulated spectroscopic ellipsometry (PMSE)] has been improved in the spectral range. Spectroscopic ellipsometry using the rotating analyzer [rotating analyzer spectroscopic ellipsometry
Publikováno v:
Semiconductor Science and Technology. 6:A146-A151
The authors report the results of optical and electrical measurements performed on two pseudomorphic ZnSe/n+GaAs heterojunctions in which the ZnSe was grown by molecular beam epitaxy. One of the ZnSe epilayers was doped as a p-n junction using Li and
Publikováno v:
Semiconductor Science and Technology. 6:A152-A156
Electrolyte electroreflectance (EER) is used to investigate the interface between undoped ZnSe and heavily n-doped GaAs. The evolution of the signal with bias allows an identification of the various features in the EER spectra. The spectra allow us t