Zobrazeno 1 - 10
of 82
pro vyhledávání: '"J. Versluys"'
Autor:
Y. Stockman, A. Deep, B. Borguet, J. Versluys, Matteo Taccola, C. Michel, A. Myszkowiak, P. Blain, Luca Maresi, M. François, A. Boueé, V. Moreau
Publikováno v:
International Conference on Space Optics — ICSO 2016.
With the development of new spectrometer concepts, it is required to adapt the calibration facilities to characterize correctly their performances. These spectro-imaging performances are mainly Modulation Transfer Function, spectral response, resolut
Autor:
Caroline A. Lindemans, Marc Bierings, A Wildt de, C E Gerhardt, Janna A. Hol, Tom F.W. Wolfs, Jaap Jan Boelens, A B J Versluys
Publikováno v:
Bone Marrow Transplantation. 49:95-101
This study was aimed at finding predictors of invasive fungal infection (IFI) after pediatric allogeneic hematopoietic SCT (HSCT). All children who received allogeneic HSCT in the Wilhelmina Children's Hospital Utrecht between 2004 and 2012 were incl
Autor:
M. J. Versluys
Publikováno v:
Isis en Occident
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::38bdad99e6990b3641b1b23376d260f0
https://doi.org/10.1163/9789047412328_017
https://doi.org/10.1163/9789047412328_017
Publikováno v:
Thin Solid Films. :434-438
The presence of deep defects in CdS/CdTe thin film solar cells strongly affects the electrical properties and as a result the performance of the cells. Therefore, it is desirable to understand the role of these defect states. This paper describes the
Publikováno v:
Journal of Applied Physics. 90:248-251
For SrS:Cu,Ag thin film phosphors, a postdeposition annealing step is imperative in order to obtain bright photo- or electroluminescence. However, it is not clear to date what is the most important effect of this treatment, a recrystallization of the
Publikováno v:
Journal of Physics: Condensed Matter. 13:5709-5716
The structural and optical properties of electron beam deposited CaS:Pb thin films were investigated as a function of annealing temperature and lead concentration. X-ray diffraction measurements show weak crystallinity for such layers. Although this
Autor:
J Versluys
Publikováno v:
Thin Solid Films.
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