Zobrazeno 1 - 8
of 8
pro vyhledávání: '"J. V. Martinez de Pinillos"'
Publikováno v:
Journal of The Electrochemical Society. 141:2478-2482
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fe35535ab60605cfa474be7dd9573605
https://doi.org/10.1149/1.2055146
https://doi.org/10.1149/1.2055146
Publikováno v:
Journal of The Electrochemical Society. 141:184-187
A dynamic dilution system, utilizing single dilution, is described that generates sub ppb concentration of impurities in bulk nitrogen. An atmosphere pressure ionization mass spectrometer (APIMS) is used to verify the linearity of the dilution system
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::46072686c7c7b29efbf8e3830648de1c
https://doi.org/10.1149/1.2054681
https://doi.org/10.1149/1.2054681
Publikováno v:
Journal of The Electrochemical Society. 139:3675-3678
Rate equation analysis is performed for the ion-molecule reactions occurring in the source of a corona discharge atmospheric pressure ionization mass spectrometer for the case of bulk nitrogen. The solutions to these equations, together with the mode
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::497da3b68ad636527bc0ef19b2f99318
https://doi.org/10.1149/1.2069142
https://doi.org/10.1149/1.2069142
Autor:
A. Hunt, R.A. Allen, Christine E. Murabito, Ronald G. Dixson, Brandon Park, J. V. Martinez de Pinillos, William F. Guthrie, Michael W. Cresswell
Publikováno v:
SPIE Proceedings.
The implementation of a new test structure for HRTEM (High-Resolution Transmission Electron Microscopy) imaging, and the use of CD AFM (CD Atomic Force Microscopy) to serve as the transfer metrology, have resulted in reductions in the uncertainties a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d79f113941d5453dda57d032ed81c1dd
https://doi.org/10.1117/12.606807
https://doi.org/10.1117/12.606807
Autor:
Michael W. Cresswell, Loren W. Linholm, Richard A. Allen, Barbara A. am Ende, Marylyn Hoy Bennett, William F. Guthrie, J. V. Martinez de Pinillos, E. Hal Bogardus, Christine E. Murabito
Publikováno v:
SPIE Proceedings.
Prototype linewidth reference materials with Critical Dimensions (CDs) as narrow as 70 nm have been patterned in silicon-on-insulator films. The sidewalls of the reference features are parallel, normal to the substrate surface, and have almost atomic
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6096d383cd83850e1ac111d7c4939a62
https://doi.org/10.1117/12.473450
https://doi.org/10.1117/12.473450
Autor:
W. Weltner, J. V. Martinez de Pinillos
Publikováno v:
The Journal of Chemical Physics. 65:4256-4263
ESR spectra have been measured of M+Cl2− ion pairs trapped in solid argon at 4° K, where M=Mg, Ca, Sr, Ba, Li, Na, and K. The derived g and hyperfine tensors of Cl2− are interpreted using the simple crystal field model of Schoemaker, and the spi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::392e9aa5e9948b8a118f2633eab8ed25
https://doi.org/10.1063/1.432834
https://doi.org/10.1063/1.432834
Publikováno v:
ACS Symposium Series ISBN: 9780841209343
Microelectronics Processing: Inorganic Materials Characterization
Microelectronics Processing: Inorganic Materials Characterization
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d1a2607a31f3a01161afcf32503a7cbe
https://doi.org/10.1021/bk-1986-0295.ch024
https://doi.org/10.1021/bk-1986-0295.ch024
Autor:
LAWRENCE A. CASPER, D. E. Passoja, A. J. Scharman, Dieter K. Schroder, Robert G. Mazur, Rodney A. Young, Ronald V. Kalin, G. A. Rozgonyi, D. K. Sadana, Mary Ryan-Hotchkiss, Paul A. Lindfors, Ronald W. Kee, Douglas L. Jones, William F. Stickle, Kenneth D. Bomben, R. G. Downing, J. T. Maki, R. F. Fleming, Allan Rosencwaig, D. E. Aspnes, Aslan Baghdadi, Fran Adar, D. C. Reynolds, W. H. Penzel, B. Shushan, E. S. K. Quan, A. Boorn, D. J. Douglas, G. Rosenblatt, Richard M. Lindstrom, Fredric D. Leipziger, Richard J. Guidoboni, Jana Houskova, Kim-Khanh N. Ho, Marjorie K. Balazs, Vineet S. Dharmadhikari, Satish K. Gupta, Roland L. Chin, D. Scott Becker, William R. Schmidt, Charlie A. Peterson, Don C. Burkman, C. E. Nowakowski, J. V. Martinez de Pinillos, J. N. Ramsey