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pro vyhledávání: '"J. S. Strane"'
Autor:
A. Gaul, Andrew M. Greene, T. Levin, Dallas Lea, Victor Chan, Samuel S. Choi, Carol Boye, S. Mattam, J. S. Strane, Sean Teehan, Dechao Guo, Gauri Karve, Marc A. Bergendahl, Brad Austin, Kangguo Cheng
Publikováno v:
IEEE Transactions on Semiconductor Manufacturing. 32:393-399
We detail the use of ring oscillators (ROs) for yield learning during the research phase of a CMOS technology generation. Failing circuits are located and classified based on electrical analysis of ROs and FETs (Field Effect Transistor) wired out fro
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fb346177db8ff7cde9e74ff311de6222
https://doi.org/10.1109/tsm.2019.2945696
https://doi.org/10.1109/tsm.2019.2945696
